Publications

Search results

Conference Paper (1)

  1. 1.
    Conference Paper
    Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)

Talk (2)

  1. 2.
    Talk
    Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. 40th IEEE Photovoltaic Specialists Conference, Denver, CO, USA (2014)
  2. 3.
    Talk
    Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Raabe, D.: Recombination activity at the atomic scale: Correlative analysis of grain boundaries in multicrystalline silicon solar cells. Euromat 2013, Sevilla, Spain (2013)
 
loading content
Go to Editor View