Publications of C. Kirchlechner

Kiener, D.; Zhang, Z.; Šturm, S.; Cazottes, S.; Imrich, P. J.; Kirchlechner, C.; Dehm, G.: Advanced nanomechanics in the TEM: Effects of thermal annealing on FIB prepared Cu samples. Philosophical Magazine 92 (25-27), 185, pp. 3269 - 3289 (2012)

Kiener, D.; Zhang, Z.; Šturm, S.; Cazottes, S.; Imrich, P. J.; Kirchlechner, C.; Dehm, G.: Advanced nanomechanics in the TEM: effects of thermal annealing on FIB prepared Cu samples. Philosophical Magazine 92 (25-27), pp. 3269 - 3289 (2012)

Moser, G.; Felber, H.; Rashkova, B.; Imrich, P. J.; Kirchlechner, C.; Grosinger, W.; Motz, C.; Dehm, G.; Kiener, D.: Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing. Praktische Metallographie-Practical Metallography 49 (6), pp. 343 - 355 (2012)

Pippan, R.; Kolednik, O.; Rashkova, B.; Kirchlechner, C.; Kiener, D.; Dehm, G.: Tiefe Einblicke in die Strukturen. Kleine Zeitung Uni 30, p. 2 - 2 (2011)

Kirchlechner, C.; Kečkéš, J.; Motz, C.; Grosinger, W.; Kapp, M. W.; Micha, J.-S.; Ulrich, O.; Dehm, G.: Impact of instrumental constraints and imperfections on the dislocation structure in micron-sized Cu compression pillars. Acta Materialia 59 (14), pp. 5618 - 5626 (2011)

Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples. Advanced Engineering Materials 13 (8), pp. 837 - 844 (2011)

Rester, M.; Fischer, F. D.; Kirchlechner, C.; Schmoelzer, T.; Clemens, H. J.; Dehm, G.: Deformation mechanisms in micron-sized PST TiAl compression samples: Experiment and model. Acta Materialia 59 (9), pp. 3410 - 3421 (2011)

Kirchlechner, C.; Kiener, D.; Motz, C.; Labat, S.; Vaxelaire, N.; Perroud, O.; Micha, J.-S.; Ulrich, O.; Thomas, O.; Dehm, G. et al.; Kečkéš, J.: Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction. Philosophical Magazine 91 (7-9), pp. 1256 - 1264 (2011)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Donges, J.; Rothkirch, A.; Klaus, M.; Genzel, C.; Kečkéš, J.: X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel. Scripta Materialia 62 (10), pp. 774 - 777 (2010)

Vaxelaire, N.; Proudhon, H.; Labat, S.; Kirchlechner, C.; Kečkéš, J.; Jacques, V.; Ravy, S.; Forest, S.; Thomas, O.: Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics 12, 035018, pp. 1 - 12 (2010)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Klaus, M.; Genzel, C.; Mitterer, C.; Kečkéš, J.: Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction. Thin Solid Films 518 (8), pp. 2090 - 2096 (2010)

Vaxelaire, N.; Labat, S.; Chamard, V.; Thomas, O.; Jacques, V.; Picca, F. E.; Ravy, S.; Kirchlechner, C.; Kečkéš, J.: 3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology. Nuclear Instruments and Methods in Physics Research Section B 268 (3-4), pp. 388 - 393 (2010)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Kečkéš, J.: Residual stresses in thermally cycled CrN coatings on steel. Thin Solid Films 517 (3), pp. 1167 - 1171 (2008)

Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, pp. 425 - 438 (Eds. Staron, P.; Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)

Robach, O.; Kirchlechner, C.; Micha, J.-S.; Ulrich, O.; Biquard, X.; Geaymond, O.; Castelnau, O.; Bornert, M.; Petit, J.; Berveiller, S. et al.; Sicardy, O.; Villanova, J.; Rieutord, F.: Laue Microdiffraction at the ESRF. In: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects, 5, pp. 156 - 204 (Eds. Barabash, R.; Ice, G.). Imperial College Press, London, UK (2014)

Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Micromechanics of Co–Nb Laves Phases: Strength, Fracture Toughness, and Hadrness as Function of Composition and Crystal Structure. In: Joint EPRI – 123HIMAT International Conference on Advances in High-Temperature Materials, 2019, pp. 11 - 21 (Eds. Shingledecker, J.; Takeyama, M.). EPRI's 9th International Conf on Advances in Materials Technology for Fossil Power Plants and the 2nd International 123HiMAT Conf on High-Temperature Materials, Nagasaki, Japan, October 21, 2019 - October 24, 2019. (2019)

Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Deformation of Micropillars of Cubic and Hexagonal NbCo₂ Laves Phases under Uniaxial Compression at Room Temperature. In: Proc. Intermetallics 2017, pp. 199 - 200 (Eds. Heilmaier, M.; Krüger, M.; Mayer, S.; Palm, M.; Stein, F.). Intermetallics 2017, Educational Center Kloster Banz, Bad Staffelstein, Germany, October 02, 2017 - October 06, 2017. Conventus Congressmanagement & Marketing GmbH, Jena, Germany (2017)

Taniguchi, S.; Soler, R.; Kirchlechner, C.; Liebscher, C.; Taniyama, A.; Dehm, G.: In-situ TEM Study of Mechanical Size Effects in TiC Strengthened Steels. Microscopy & Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. Proceedings of Microscopy & Microanalysis 2017 23 (S1), pp. 732 - 733 (2017)

Putz, B.; Glushko, O.; Marx, V. M.; Kirchlechner, C.; Többens, D. M.; Cordill, M. J.: Electro-mechanical performance of thin gold films on polyimide. In: MRS Advances, Vol. 1, pp. 773 - 778. Materials Research Society (2016)

Motz, C.; Kiener, D.; Kirchlechner, C.; Grosinger, W.; Pippan, R.; Dehm, G.: Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In: 10th Multinational Congress on Microscopy (MCM 2011), pp. 57 - 58. 10th Multinational Congress on Microscopy (MCM 2011). (2011)