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Zhang, S.; Li, T.; Gault, B.; Hufnagel, A.; Hoffmann, R.; Harzer, T.; Breitbach, B.; Fattakhova-Rohlfing, D.; Bein, T.; Scheu, C.: Mapping of Sn dopant in hematite photoanodes by STEM-EELS and atom probe tomography. EDGE 2017: Enhanced Data Generated by Electrons, 8th International Workshop on Electron Energy Loss Spectroscopy and Related Techniques, Okuma, Okinawa, Japan (2017)