Search results

Journal Article (2)

1.
Journal Article
Pérez León, C.; Drees, H.; Wippermann, S. M.; Marz, M.; Hoffmann-Vogel, R.: Atomically resolved scanning force studies of vicinal Si(111). Physical Review B 95 (24), 245412 (2017)
2.
Journal Article
Pérez León, C.; Drees, H.; Wippermann, S. M.; Marz, M.; Hoffmann-Vogel, R.: Atomic-Scale Imaging of the Surface Dipole Distribution of Stepped Surfaces. The Journal of Physical Chemistry Letters 7 (3), pp. 426 - 430 (2016)

Talk (1)

3.
Talk
Pérez León, C.; Drees, H.; Marz, M.; Wippermann, S. M.; Hoffmann-Vogel, R.: A joint first principles and Kelvin Probe Force Microscopy study of stepped Silicon Surfaces with Unprecedented Resolution. APS March Meeting 2015 , San Antonio, TX, USA (2015)
Go to Editor View