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Journal Article (6)

1.
Journal Article
Virdi, K. S.; Kauffmann, Y.; Ziegler, C.; Ganter, P.; Blaha, P.; Lotsch, B. V.; Kaplan, W. D.; Scheu, C.: Band gap extraction from individual two-dimensional perovskite nanosheets using valence electron energy loss spectroscopy. The Journal of Physical Chemistry C 120 (20), pp. 11170 - 11179 (2016)
2.
Journal Article
Dennenwaldt, T.; Lübbe, M.; Winklhofer, M.; Müller, A.; Döblinger, M.; Nabi, H. S.; Gandman, M.; Cohen-Hyams, T.; Kaplan, W. D.; Moritz, W. et al.; Pentcheva, R.; Scheu, C.: Insights into the structural, electronic, and magnetic properties of Fe2-xTixO3/Fe2O3 thin films with x=0.44 grown on Al2O3 (0001). Journal of Materials Science 50 (1), pp. 122 - 137 (2015)
3.
Journal Article
Dennenwaldt, T.; Lübbe, M.; Winklhofer, M.; Müller, A.; Döblinger, M.; Nabi, H. S.; Gandman, M.; Cohen-Hyams, T.; Kaplan, W. D.; Moritz, W. et al.; Pentcheva, R.; Scheu, C.: Insights into the structural, electronic, and magnetic properties of Fe2-xTixO3/Fe2O3 thin films with x=0.44 grown on Al2O3 (0001). Journal of Materials Science 50 (1), pp. 122 - 137 (2015)
4.
Journal Article
Scheu, C.; Dehm, G.; Kaplan, W. D.: Equilibrium amorphous silicon-calcium-oxygen films at interfaces in copper-alumina composites prepared by melt infiltration. Journal of the American Ceramic Society 84 (3), pp. 623 - 630 (2001)
5.
Journal Article
Scheu, C.; Dehm, G.; Kaplan, W. D.; García, D. E.; Claussen, N. E.: Microstructure of alumina composites containing niobium and niobium aluminides. Journal of the American Ceramic Society 83 (2), pp. 397 - 402 (2000)
6.
Journal Article
Scheu, C.; Dehm, G.; Kaplan, W. D.; Wagner, F.; Claussen, N. E.: Microstructure and Phase Evolution of Niobium-Aluminide-Alumina Composites Prepared by Melt-Infiltration. Physica Status Solidi A 166 (1), pp. 241 - 255 (1998)

Conference Paper (1)

7.
Conference Paper
Scheu, C.; Dehm, G.; Kaplan, W. D.; Vilela, D.; Claussen, N. E.: Microstructure of Nb Based Al2O3 Composites. In: Proc. of 56rd Annual Meeting of MSA, pp. 588 - 589. 56rd Meeting of the Microscopy Society of America, Atlanta, GA, USA, July 12, 1998 - July 16, 1998. (1998)
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