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Journal Article (6)

  1. 1.
    Journal Article
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: On pinning-depinning and microkink-flow in solid state dewetting: Insights by in-situ ESEM on Al thin films. Acta Materialia 165, pp. 153 - 163 (2019)
  2. 2.
    Journal Article
    Budak, Ö.; Srimuk, P.; Tolosa, A.; Fleischmann, S.; Lee, J.; Hieke, S. W.; Frank, A.; Scheu, C.; Presser, V.: Vanadium (III) Oxide/Carbon Core/Shell Hybrids as an Anode for Lithium‐Ion Batteries. Batteries & Supercaps 2 (1), pp. 74 - 82 (2019)
  3. 3.
    Journal Article
    Hieke, S. W.; Dehm, G.; Scheu, C.: Annealing induced void formation in epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 140, pp. 355 - 365 (2017)
  4. 4.
    Journal Article
    Toparli, C.; Hieke, S. W.; Altin, A.; Kasian, O.; Scheu, C.; Erbe, A.: State of the Surface of Antibacterial Copper in Phosphate Buffered Saline. Journal of the Electrochemical Society 164 (12), pp. H734 - H742 (2017)
  5. 5.
    Journal Article
    Hieke, S. W.; Breitbach, B.; Dehm, G.; Scheu, C.: Microstructural evolution and solid state dewetting of epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 133, pp. 356 - 366 (2017)
  6. 6.
    Journal Article
    Raghavan, R.; Harzer, T. P.; Djaziri, S.; Hieke, S. W.; Kirchlechner, C.; Dehm, G.: Maintaining strength in supersaturated copper–chromium thin films annealed at 0.5 of the melting temperature of Cu. Journal of Materials Science 52 (2), pp. 913 - 920 (2017)

Conference Paper (2)

  1. 7.
    Conference Paper
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Ed. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, August 21, 2017 - August 25, 2017. Universität Regensburg, Regensburg (2017)
  2. 8.
    Conference Paper
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings. The 16th European Microscopy Congress (EMC 2016), Lyon, France, August 28, 2016 - September 02, 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Talk (8)

  1. 9.
    Talk
    Frank, A.; Dias, M.; Hieke, S. W.; Kruth, A.; Scheu, C.: Electron microscopic investigation of the influence of plasma parameters on VOx films deposited by a plasma ion assisted process. E-MRS 2019 Spring Meeting, Nice, France (2019)
  2. 10.
    Talk
    Frank, A.; Hieke, S. W.; Dias, M.; Fleischmann, S.; Presser, V.; Kruth, A.; Scheu, C.: Transmission electron microscopy study of carbon/metal oxide hybrid materials for Energy Storage Application. 19th International Microscopy Congress IMC19, Sydney, Australia (2018)
  3. 11.
    Talk
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg, Erlangen, Germany (2017)
  4. 12.
    Talk
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. 13th Multinational Congress on Microscopy, Rovinj, Croatia (2017)
  5. 13.
    Talk
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Microscopy Conference 2017 – Dreiländertagung (MC 2017), Lausanne, Switzerland (2017)
  6. 14.
    Talk
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. The 16th European Microscopy Congress (EMC 2016), Lyon, France (2016)
  7. 15.
    Talk
    Hieke, S. W.; Dehm, G.; Scheu, C.: Solid state dewetting of epitaxial Al thin films on sapphire studied by electron microscopy. Materials Research Society Fall Meeting & Exhibition 2016 (MRS Fall 2016), Boston, MA, USA (2016)
  8. 16.
    Talk
    Hieke, S. W.; Dehm, G.; Scheu, C.: Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Understanding Grain Boundary Migration: Theory Meets Experiment, Günzburg/Donau, Germany (2015)

Poster (6)

  1. 17.
    Poster
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: In-situ observation of irregular void growth in Al thin films during solid state dewetting. 19th International Microscopy Congress (IMC19), Sydney, Australia (2018)
  2. 18.
    Poster
    Hieke, S. W.; Dehm, G.; Scheu, C.: Texture evolution and solid state dewetting of passivated Al thin films on Al2O3. International GRK 1896 Satellite Symposium "In Situ Microscopy with Electrons, X-rays and Scanning Probes", Erlangen, Germany (2017)
  3. 19.
    Poster
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. TEM-UCA: Transmission Electron Microscopy of Nanomaterials - European Summer Workshop (TEM-UCA 2015), Cádiz, Spain (2015)
  4. 20.
    Poster
    Hieke, S. W.; Dehm, G.; Scheu, C.: Electron microscopy investigation of solid state dewetted epitaxial Al thin films on sapphire. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices (IAMNano 2015), Hamburg, Germany (2015)
 
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