![© Max-Planck-Institut für Eisenforschung GmbH © Max-Planck-Institut für Eisenforschung GmbH](/3002673/header_image-1456241897.jpg?t=eyJ3aWR0aCI6ODQ4LCJmaWxlX2V4dGVuc2lvbiI6ImpwZyIsIm9ial9pZCI6MzAwMjY3M30%3D--970de769b40479088b8b8f4397f5acec0323386e)
Publications of Daniel Gall
All genres
Journal Article (3)
1.
Journal Article
519 (5), pp. 1662 - 1667 (2010)
Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. Thin Solid Films 2.
Journal Article
518 (5), pp. 1517 - 1521 (2009)
Can micro-compression testing provide stress–strain data for thin films? A comparative study using Cu, VN, TiN and W coatings. Thin Solid Films 3.
Journal Article
153 (7), pp. 257 - 262 (2008)
Testing thin films by microcompression: Benefits and limits. BHM Berg- und Hüttenmännische Monatshefte