Scientific Events

Development of innovative characterization tools is of paramount importance to advance the frontiers of science and technology in nearly all areas of research. In order to overcome the limitations of individual techniques, correlative microscopy has been recognized as a powerful approach to obtain complementary information about the investigated materials. High-resolution imaging techniques such as Transmission Electron Microscopy (TEM) or Helium Ion Microscopy (HIM) offer excellent spatial resolution. However, the analytical techniques associated with TEM such as Energy Dispersive X-ray spectroscopy (EDX) or Electron Energy-Loss Spectroscopy (EELS) are inadequate for the analysis of (i) isotopes, (ii) trace concentrations (< 0.1 at. % or < 1000 ppm) and (iii) light elements (H, Li, B). Secondary Ion Mass Spectrometry (SIMS), on the other hand, has several advantages such as the possibility to analyse elements and isotopes of all elements of the periodic table while also providing high-sensitivity to detect even trace concentrations. However, the main drawbacks of SIMS are (i) difficulty in quantification and (ii) lateral resolution of SIMS imaging is fundamentally limited by ion-solid interaction volume to ~10 nm. Owing to the complementary strengths of SIMS imaging, we developed new in-situ and operando instrumentations for correlative microscopy combining electron microscopy and SIMS imaging. In this presentation, we will discuss the instrumentation development aspects of correlative microscopy techniques based on SIMS imaging. With a range of examples from energy materials, we will show the powerful correlative microscopy possibilities that emerge due to these new in-situ and operando methods and compare with ex-situ correlation. Our recent work in the application of these methods in hydrogen containing materials and Li ion batteries will be reviewed. [more]

The mechanical behavior of most metals in engineering applications is dominated by the grain size. Physics-based models of the interaction between dislocations and the grain boundary are important to correctly predict the plastic deformation behavior of polycrystalline materials. Dislocation-grain boundary interaction is complex and a challenge to model. In this talk, I will present a short history, opportunities, and challenges for modeling grain boundaries at the mesoscale using discrete dislocation dynamics. This includes an effective model and a novel model for physical transmission of dislocations through grain boundaries with a residual grain boundary dislocation. In addition, I will provide an outlook how these models can and should be calibrated using micromechanical experiments on bicrystals. [more]

Many of the functional materials we hope to leverage for next-generation technological applications — such as computing, energy harvesting and storage, or communication devices — draw their unique and sometimes exotic properties from a suite of interactions between the atoms, spins, and charges in a crystalline lattice. With direct, real-space access to these order parameters down to the atomic scale, the scanning transmission electron microscope (STEM) is a powerful tool to probe the fundamental framework of such compounds and their properties. As an example of this, I will show how advanced STEM techniques can elucidate key questions about the landscape of superconductivity in recently discovered nickelates. But many of these functional systems are most useful (and therefore interesting) away from the ambient conditions of most typical high-resolution STEM experiments, for instance at cryogenic or elevated temperatures or under an external bias. It is therefore imperative to expand the environmental compatibility of these methods through the parallel development of both hardware and data processing tools, key examples of which will be highlighted here. [more]