Symposium at MSE 2020: C02: "Advanced Transmission Electron Microscopy for Materials Science C02: Advanced Transmission Electron Microscopy for Materials Science"

The development of aberration corrected electron optics, monochromators and sensitive high-speed detectors has revolutionized the characterization of complex materials. In the transmission electron microscope (TEM), the atomic structure, composition, bonding, 3D structure and morphology as well as the response of materials under different stimuli can be explored in a single instrument. The rapid development of novel techniques and hardware capabilities is continuously pushing the boundaries of TEM. The aim of the proposed symposium is to bring together experts with a background in technique development with specialists who characterize advanced materials by TEM.