Singh, M. P.; Kim, S.-H.; Zhou, X.; Kwak, H.; Antonov, S.; Aota, L. S.; Jung, C.; Jung, Y. S.; Gault, B.: Atomic scale evolution of the surface chemistry in Li[Ni,Mn,Co]O2 cathode for Li-ion batteries stored in air. arXiv (2022)

Bhatt, S.; Katnagallu, S.; Neugebauer, J.; Freysoldt, C.: Accurate computation of chemical contrast in field ion microscopy. arXiv (2022)

Douglas, J. O.; Conroy, M. A.; Giuliani, F.; Gault, B.: In-situ sputtering from the micromanipulator to enable cryogenic preparation of specimens for atom probe tomography by focused-ion beam. arXiv (2022)

Kim, S.-H.; Dong , K.; Zhao, H.; El-Zoka, A.; Zhou, X.; Woods, E.; Giuliani, F.; Manke, I.; Raabe, D.; Gault, B.: Understanding the degradation of a model Si-anode in Li-ion battery at the atomic-scale. arXiv (2022)

Kim, S.-H.; Stephenson, L.; Kwiatkowski da Silva, A.; Gault, B.; El-Zoka, A.: Phase Separation and Anomalous Volume Expansion in Frozen Microscale Eutectic Indium-Gallium upon Remelting. arXiv (2022)

Yoo, S.-H.; Kim, S.-H.; Woods, E.; Gault, B.; Todorova, M.; Neugebauer, J.: Origins of the hydrogen signal in atom probe tomography. arXiv (2021)