Mulcahy, N.; Worch, L.; Jannat, R.; Sun, H.; Ryan, M.; Gault, B.; Douglas, J.; Conroy, M.: Correlative In-Situ Liquid Cell Electrochemistry TEM and Cryogenic APT of Liquid-Solid Interfaces. Microscopy and Microanalysis 30 (Supplement_1), ozae044.043 (2024)

Saxena, A.; Kühbach, M.; Katnagallu, S.; Kontis, P.; Gault, B.; Freysoldt, C.: Analyzing Linear Features in Atom Probe Tomography Datasets using Skeletonization. Microscopy and Microanalysis 30 (Supplement_1), ozae044.022 (2024)

Saxena, A.; Polin, N.; Katnagallu, S.; Gault, B.; Freysoldt, C.: A Machine Learning based Workflow to Quantify Atom Probe Tomography Data. Microscopy and Microanalysis 30 (Supplement_1), ozae044.029 (2024)

Topore, G.; Douglas, J.; Keeney, L.; Gault, B.; Conroy, M.: How Can 4D-STEM Inform Atom Probe Experiments? Relating Structure and Composition of Multiferroic Oxides at the Atomic Scale. Microscopy and Microanalysis 30 (Supplement_1), ozae044.021 (2024)

Topore, G.; Keeney, L.; Ramasse, Q.; Griffin, S.; Gault, B.; Conroy, S.: Probing Sub-Unit Cell Polarization Waves in Multiferroic Layered Oxides with EELS. Microscopy and Microanalysis 30 (Supplement_1), ozae044.749 (2024)

Bauer, S.; Benner, P.; Bereau, T.; Blum, V.; Boley, M.; Carbogno, C.; Catlow, C. R. A.; Dehm, G.; Eibl, S.; Ernstorfer, R. et al.; Fekete, A.; Foppa, L.; Fratzl, P.; Freysoldt, C.; Gault, B.; Ghiringhelli, L. M.; Giri, S. K.; Gladyshev, A.; Goyal, P.; Hattrick-Simpers, J.; Kabalan, L.; Karpov, P.; Khorrami, M. S.; Koch, C.; Kokott, S.; Kosch, T.; Kowalec, I.; Kremer, K.; Leitherer, A.; Li, Y.; Liebscher, C.; Logsdail, A. J.; Lu, Z.; Luong, F.; Marek, A.; Merz, F.; Mianroodi, J. R.; Neugebauer, J.; Pei, Z.; Purcell, T.; Raabe, D.; Rampp, M.; Rossi, M.; Rost, J.-M.; Saal, J. E.; Saalmann, U.; Sasidhar, K. N.; Saxena, A.; Sbailo, L.; Scheidgen, M.; Schloz, M.; Schmidt, D. F.; Teshuva, S.; Trunschke, A.; Wei, Y.; Weikum, G.; Xian, R. P.; Yao, Y.; Yin, J.; Zhao, M.; Scheffler, M.: Roadmap on Data-Centric Materials Science. Modelling and Simulation in Materials Science and Engineering 32 (6), 063301 (2024)

Weiss, C.; Waszkiewicz, O.; Maier, M.; Hofmaenner, T.; El-Zoka, A.; Maier, U.: Advancements in Controlled Environment Workflows for Cryo-APT and Correlative Studies. Microscopy and Microanalysis 30 (Supplement_1), pp. 535 - 537 (2024)

Zhang, J.; Pang, X.; Li, Y.; Wei, S.; Yang, C.; Pan, S.; Sun, B.; Zhou, D.; Huang, X.; Zhang, D. et al.; Qin, G.: Tuning generalized planar fault energies to enable deformation twinning in nanocrystalline aluminum alloys. International Journal of Plasticity 178, 104018 (2024)

Dubosq, R.; Woods, E.; Gault, B.; Best, J. P.: Correction: Electron microscope loading and in situ nanoindentation of water ice at cryogenic temperatures. PLOS ONE 19 (6), e0306374 (2024)

Prithiv, T. S.; Kloenne, Z.; Mohan Das, S.; Zheng, Y.; Fraser, H. L.; Gault, B.; Antonov, S.: Mechanisms of grain boundary a precipitation in the metastable b-titanium Ti–5Al–5Mo–5V–3Cr. Acta Materialia 272, 119955 (2024)

Sandim, M. J. R.; Nagamine, L. C. M.; Kwiatkowski da Silva, A.; Aota, L. S.; Han, L.; Cohen, R.; Zschommler Sandim, H. R.; Gault, B.; Souza Filho, I. R.: Anomalous magnetization induced by local chemistry fluctuations in Mn-containing a'-martensite. Acta Materialia 272, 119956 (2024)

Woods, E.; Saksena, A.; El-Zoka, A.; Stephenson, L.; Schwarz, T.; Singh, M. P.; Aota, L. S.; Kim, S.-H.; Schneider, J.; Gault, B.: Nanoporous Gold Thin Films as Substrates to Analyze Liquids by Cryo-atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1172 - 1180 (2024)

Heuser, D.; Dubosq, R.; Petrishcheva, E.; Bian, G.; Rentenberger, C.; Lengauer, C.; Gault, B.; Habler, G.; Abart, R.: Coherent solvus of disordered alkali feldspar: experiment, atom probe tomography and thermodynamic model. Contributions to Mineralogy and Petrology 179 (6), 68 (2024)

Kraemer, M.; Favelukis, B.; Sokol, M.; Rosen, B. A.; Eliaz, N.; Kim, S.-H.; Gault, B.: Facilitating Atom Probe Tomography of 2D MXene Films by In Situ Sputtering. Microscopy and Microanalysis 30 (6), pp. 1057 - 1065 (2024)

Jang, K.; Kim, M.-Y.; Jung, C.; Kim, S.-H.; Choi, D.; Park, S.-C.; Scheu, C.; Choi, P.-P.: Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1047 - 1056 (2024)

Johansen, M.; Singh, M. P.; Xu, J.; Asp, L. E.; Gault, B.; Liu, F.: Unravelling lithium distribution in carbon fibre electrodes for structural batteries with atom probe tomography. Carbon 225, 119091 (2024)

Wang, Y.; Chen, X.; Zhao, H.; Sun, W.; Zhang, Q.; Gault, B.; Hutchinson, C.: Effect of cluster chemistry on the strengthening of Al alloys. Acta Materialia 269, 119809 (2024)

Sharma, V. M.; Svetlizky, D.; Das, M.; Tevet, O.; Krämer, M.; Kim, S.-H.; Gault, B.; Eliaz, N.: Microstructure and mechanical properties of bulk NiTi shape memory alloy fabricated using directed energy deposition. Additive Manufacturing 86, 104224 (2024)

Chen, X.; Zhou, X.; De Geuser, F.; Kwiatkowski da Silva, A.; Zhao, H.; Woods, E.; Liu, C.; Ponge, D.; Gault, B.; Raabe, D.: Atom probe tomography-assisted kinetic assessment of spinodal decomposition in an Al-12.5 at.%Zn alloy. Acta Materialia 268, 119757 (2024)

Dubosq, R.; Camacho, A.; Rogowitz, A.; Zhang, S.; Gault, B.: Influence of high-strain deformation on major element mobility in garnet: Nanoscale evidence from atom probe tomography. Journal of Metamorphic Geology 42 (3), pp. 355 - 372 (2024)