Conference Paper
Peranio, N.; Eibl, O.; Nurnus, J.: Structural analysis of Bi
2Te
3 superlattices epitaxially grown on BaF
2 by transmission electron microscopy. In: ICT2004. 23th International Conference on Thermoelectrics (ICT2004), Adelaide, Australia. IEEE, Piscataway, NJ, USA (2005)