Home Research Independent Research Groups Nanoanalytics and Interfaces Research Topics Characterizing defect phases at surfaces and interfaces Publications of J. Andersons All genres Journal Article (1) Journal Article (1) 1. Journal Article Wellner, P.; Kraft, O.; Dehm, G.; Andersons, J.; Arzt, E.: Channel cracking of β-NiAl thin films on Si substrates. Acta Materialia 52 (8), pp. 2325 - 2336 (2004) MPG.PuRe DOI
