Home Research Independent Research Groups Nanoanalytics and Interfaces Research Topics Characterizing defect phases at surfaces and interfaces Publications of Darren Edwards All genres Journal Article (1) Journal Article (1) 1. Journal Article Kutschej, K.; Rashkova, B.; Shen, J.; Edwards, D.; Mitterer, C.; Dehm, G.: Experimental studies on epitaxially grown TiN and VN films. Thin Solid Films 516 (2-4), pp. 369 - 373 (2007) MPG.PuRe DOI
