Publications of Peter Johann Felfer

Gault, B.; Saksena, A.; Sauvage, X.; Bagot, P.; Aota, L. S.; Arlt, J.; Belkacemi, L. T.; Boll, T.; Chen, Y.-S.; Daly, L. et al.; Djukic, M.; Douglas, J.; Duarte, M. J.; Felfer, P. J.; Forbes, R.; Fu, J.; Gardner, H.; Gemma, R.; Gerstl, S. S. A.; Gong, Y.; Hachet, G.; Jakob, S.; Jenkins, B. M.; Jones, M. E.; Khanchandani, H.; Kontis, P.; Krämer, M.; Kühbach, M.; Marceau, R. K. W.; Mayweg, D.; Moore, K.; Nallathambi, V.; Ott, B.; Poplawsky, J. D.; Prosa, T.; Pundt, A.; Saha, M.; Schwarz, T.; Shang, Y.; Shen, X.; Vrellou, M.; Yu, Y.; Zhao, Y.; Zou, B.: Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1205 - 1220 (2024)

Makineni, S. K.; Lenz, M.; Kontis, P.; Li, Z.; Kumar, A.; Felfer, P. J.; Neumeier, S.; Herbig, M.; Spiecker, E.; Raabe, D. et al.; Gault, B.: Correlative Microscopy—Novel Methods and Their Applications to Explore 3D Chemistry and Structure of Nanoscale Lattice Defects: A Case Study in Superalloys. JOM-Journal of the Minerals Metals & Materials Society 70 (9), pp. 1736 - 1743 (2018)

Li, T.; Kasian, O.; Cherevko, S.; Zhang, S.; Geiger, S.; Scheu, C.; Felfer, P. J.; Raabe, D.; Gault, B.; Mayrhofer, K. J. J.: Atomic-scale insights into surface species of electrocatalysts in three dimensions. Nature Catalysis 1 (4), pp. 300 - 305 (2018)

Eder, K.; Felfer, P. J.; Gault, B.; Ceguerre, A. V.; La Fontaine, A.; Masters, A. F.; Maschmeyer, T.; Cairney, J. M.: A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers. Langmuir 33 (38), pp. 9573 - 9581 (2017)

Cairney, J. M.; Rajan, K. K.; Haley, D.; Gault, B.; Bagot, P. A. J.; Choi, P.-P.; Felfer, P. J.; Ringer, S. P.; Marceau, R. K. W.; Moody, M. P.: Mining information from atom probe data. Ultramicroscopy 159, pp. 324 - 337 (2015)

Ceguerra, A. V.; Breen, A. J.; Stephenson, L.; Felfer, P. J.; Araullo-Peters, V. J.; Liddicoat, P. V.; Cui, X. Y.; Yao, L.; Haley, D.; Moody, M. P. et al.; Gault, B.; Cairney, J. M.; Ringer, S. P.: The rise of computational techniques in atom probe microscopy. Current Opinion in Solid State and Materials Science 17 (5), pp. 224 - 235 (2013)