Publications of Tobias Oellers

Chakraborty, J.; Oellers, T.; Raghavan, R.; Ludwig, A.; Dehm, G.: Microstructure and residual stress evolution in nanocrystalline Cu–Zr thin films. Journal of Alloys and Compounds 896, 162799 (2022)

Oellers, T.; Arigela, V. G.; Kirchlechner, C.; Dehm, G.; Ludwig, A.: Thin-Film Microtensile-Test Structures for High-Throughput Characterization of Mechanical Properties. ACS Combinatorial Science 22 (3), pp. 142 - 149 (2020)

Oellers, T.: Development of combinatorial methods to tailor electrical and mechanical properties of Cu-based thin-film structures. Dissertation, Ruhr-Universität Bochum (2022)