Publications of Yuan Yu

Yu, Y.; Sheskin, A.; Wang, Z.; Uzhansky, A.; Natanzon, Y.; Dawod, M.; Abdellaoui, L.; Schwarz, T.; Scheu, C.; Wuttig, M. et al.; Cojocaru-Mirédin, O.; Amouyal, Y.; Zhang, S.: Ostwald Ripening of Ag₂Te Precipitates in Thermoelectric PbTe: Effects of Crystallography, Dislocations, and Interatomic Bonding. Advanced Engineering Materials 14 (19), 2304442 (2024)

Zhang, C.; Lai, Q.; Wang, W.; Zhou, X.; Lan, K.; Hu, L.; Cai, B.; Wuttig, M.; He, J.-Q.; Liu, F. et al.; Yu, Y.: Gibbs Adsorption and Zener Pinning Enable Mechanically Robust High-Performance Bi₂Te₃-Based Thermoelectric Devices. Advanced Science 10 (26), 2302688 (2023)

Luo, T.; Serrano Sanchez, F. M.; Bishara, H.; Zhang, S.; Bueno Villoro, R.; Kuo, J. J.; Felser, C.; Scheu, C.; Snyder, G. J.; Best, J. P. et al.; Dehm, G.; Yu, Y.; Raabe, D.; Fu, C.; Gault, B.: Dopant-segregation to grain boundaries controls electrical conductivity of η-type NbCo(Pt)Sn half-Heusler alloy mediating thermoelectric performance. Acta Materialia 217, 117147 (2021)

Luo, T.; Kuo, J. J.; Griffith, K. J.; Imasato, K.; Cojocaru-Mirédin, O.; Wuttig, M.; Gault, B.; Yu, Y.; Snyder, G. J.: Nb-Mediated Grain Growth and Grain-Boundary Engineering in Mg₃Sb₂-Based Thermoelectric Materials. Advanced Functional Materials 31 (28), 2100258 (2021)

Abdellaoui, L.; Chen, Z.; Yu, Y.; Luo, T.; Hanus, R.; Schwarz, T.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Snyder, G. J.; Raabe, D. et al.; Pei, Y.; Scheu, C.; Zhang, S.: Parallel Dislocation Networks and Cottrell Atmospheres Reduce Thermal Conductivity of PbTe Thermoelectrics. Advanced Functional Materials 31 (20), 2101214 (2021)

Male, J. P.; Abdellaoui, L.; Yu, Y.; Zhang, S.; Pieczulewski, N.; Cojocaru-Mirédin, O.; Scheu, C.; Snyder, G. J.: Dislocations Stabilized by Point Defects Increase Brittleness in PbTe. Advanced Functional Materials, 2108006 (2021)

Yu, Y.; Zhou, C.; Zhang, S.; Zhu, M.; Wuttig, M.; Scheu, C.; Raabe, D.; Snyder, G. J.; Gault, B.; Cojocaru-Mirédin, O.: Revealing nano-chemistry at lattice defects in thermoelectric materials using atom probe tomography. Materials Today 32, pp. 260 - 274 (2020)