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Journal Article (2)

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Journal Article
Stelzer, B.; Chen, X.; Bliem, P.; Hans, M.; Völker, B.; Sahu, R.; Scheu, C.; Primetzhofer, D.; Schneider, J. M.: Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements. Scientific Reports 9, 8266 (2019)
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