Search results

Journal Article (3)

1.
Journal Article
Lim, J.; Kim, S.-H.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO2 Nanowires. Angewandte Chemie, International Edition in English 59 (14), pp. 5651 - 5655 (2020)
2.
Journal Article
Kim, S.-H.; Lim, J.; Sahu, R.; Kasian, O.; Stephenson, L.; Scheu, C.; Gault, B.: Direct Imaging of Dopant and Impurity Distributions in 2D MoS2. Advanced Materials 32 (8), 1907235 (2020)
3.
Journal Article
Zhang, S.; Ahmet, I.; Kim, S.-H.; Kasian, O.; Mingers, A. M.; Schnell, P.; Kölbach, M.; Lim, J.; Fischer, A.; Mayrhofer, K. J. J. et al.; Cherevko, S.; Gault, B.; van de Krol, R.; Scheu, C.: Different Photostability of BiVO4 in Near-pH-Neutral Electrolytes. ACS Applied Energy Materials (2020)

Talk (1)

4.
Talk
Lim, J.; Kim, S.-H.; Sahu, R.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Detection of trace impurities and other defects in functional nanomaterials. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019 , Düsseldorf, Germany (2019)
Go to Editor View