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Journal Article (5)

  1. 1.
    Journal Article
    Dehm, G.; Scheu, C.; Rühle, M.; Raj, R.: Growth and Structure of Internal Cu/Al2O3 and Cu/Ti/Al2O3 Interfaces. Acta Materialia 46 (3), pp. 759 - 772 (1998)
  2. 2.
    Journal Article
    Dehm, G.; Rühle, M.; Conway, H. D.; Raj, R.: A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire. Acta Materialia 45 (2), pp. 489 - 499 (1997)
  3. 3.
    Journal Article
    Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al2O3. Materials Science Forum 207-209 (1), pp. 217 - 220 (1996)
  4. 4.
    Journal Article
    Dehm, G.; Raj, R.; Rühle, M.: Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum 207-209 (2), pp. 597 - 600 (1996)
  5. 5.
    Journal Article
    Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy. Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties 71 (6), pp. 1111 - 1124 (1995)

Conference Paper (2)

  1. 6.
    Conference Paper
    Dehm, G.; Raj, R.; Rühle, M.: Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II), Vol. 403, pp. 151 - 156. 1996 MRS Fall Meeting & Exhibit, Boston, MA, USA, December 02, 1996 - December 06, 1996. Materials Research Society, Boston, MA, USA (2011)
  2. 7.
    Conference Paper
    Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Structure of Copper/Sapphire Interfaces. In: Electron Microscopy 1994: Proceedings of the 13th International Congress on Electron Microscopy, Applications in Materials Sciences, Vol. 2A-2B, pp. 277 - 278 (Ed. Jouffrey, B.). 13th International Congress on Electron Microscopy , Paris, France, July 17, 1994 - July 22, 1994. Les Editions de Physique; 1994 (1994)
 
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