Publications

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Journal Article (2)

  1. 1.
    Journal Article
    Pérez León, C.; Drees, H.; Wippermann, S. M.; Marz, M.; Hoffmann-Vogel, R.: Atomically resolved scanning force studies of vicinal Si(111). Physical Review B 95 (24), 245412 (2017)
  2. 2.
    Journal Article
    Pérez León, C.; Drees, H.; Wippermann, S. M.; Marz, M.; Hoffmann-Vogel, R.: Atomic-Scale Imaging of the Surface Dipole Distribution of Stepped Surfaces. The Journal of Physical Chemistry Letters 7 (3), pp. 426 - 430 (2016)

Talk (1)

  1. 3.
    Talk
    Pérez León, C.; Drees, H.; Marz, M.; Wippermann, S. M.; Hoffmann-Vogel, R.: A joint first principles and Kelvin Probe Force Microscopy study of stepped Silicon Surfaces with Unprecedented Resolution. APS March Meeting 2015 , San Antonio, TX, USA (2015)
 
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