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Dehm, G.; Medres, B. S.; Shepeleva, L.; Scheu, C.; Bamberger, M. S.; Mordike, B. L.; Mordike, S.; Ryk, G.; Halperin, G.; Etsion, I.: Microstructure and Tribological Properties of Ni-Based Claddings on Cu Substrates. WEAR 225-229 (1), pp. 18 - 26 (1999)

Scheu, C.; Dehm, G.; Rühle, M.; Brydson, R.: Electron-energy-loss spectroscopy studies of Cu-α-Al₂O₃ interfaces grown by molecular beam epitaxy. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties 78 (2), pp. 439 - 465 (1998)

Dehm, G.; Scheu, C.; Rühle, M.; Raj, R.: Growth and Structure of Internal Cu/Al₂O₃ and Cu/Ti/Al₂O3 Interfaces. Acta Materialia 46 (3), pp. 759 - 772 (1998)

Scheu, C.; Dehm, G.; Kaplan, W. D.; Wagner, F.; Claussen, N. E.: Microstructure and Phase Evolution of Niobium-Aluminide-Alumina Composites Prepared by Melt-Infiltration. Physica Status Solidi A 166 (1), pp. 241 - 255 (1998)

Dehm, G.; Scheu, C.; Möbus, G.; Brydson, R.; Rühle, M.: Synthesis of Analytical and High Resolution Transmission Electron Microscopy to Determine the Interface Structure of Cu/Al₂O₃. Ultramicroscopy 67 (1-4), pp. 207 - 217 (1997)

Dehm, G.; Ernst, F.; Mayer, J.; Möbus, G.; Müllejans, H.; Phillipp, F.; Scheu, C.; Rühle, M.: Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung. Zeitschrift für Metallkunde 87 (11), pp. 898 - 910 (1996)

Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al₂O₃. Materials Science Forum 207-209 (1), pp. 217 - 220 (1996)

Scheu, C.; Dehm, G.; Müllejans, H.; Rühle, M.: Electron Energy-Loss Spectroscopy at Cu/Al₂O₃ and Ti/Al₂O₃ Interfaces. Materials Science Forum 207-209 (1), pp. 181 - 184 (1996)

Scheu, C.; Dehm, G.; Müllejans, H.; Brydson, R.; Rühle, M.: Electron Energy-Loss Near-Edge Structure of Metal-Alumina Interfaces. Microscopy Microanalysis Microstructures 6 (1), pp. 19 - 31 (1995)

Clemens, H.; Mayer, S.; Scheu, C.: Microstructure and Properties of Engineering Materials. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, pp. 3 - 20 (Eds. Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)

Microstructure of Ni₂B Laser-Induced Surface-Alloyed α-Fe (Materials Resaerch Symposium Proceedings, Phase Transformations and Systems Driven far from Equilibrium, 481). MRS Fall Meeting´97, Boston, MA, USA. (2001)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Ed. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, August 21, 2017 - August 25, 2017. Universität Regensburg, Regensburg (2017)

Folger, A.; Wisnet, A.; Scheu, C.: Defects in as-grown vs. annealed rutile titania nanowires and their effect on properties. EMC 2016, 16th European Microscopy Congress, Lyon, France, August 28, 2016 - September 02, 2016. European Microscopy Congress 2016: Proceedings, pp. 409 - 410 (2016)

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, pp. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, August 28, 2016 - September 02, 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol. 22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)

Guggenmos, A.; Radünz, S.; Rauhut, R.; Hofstetter, M.; Venkatesan, S.; Wochnik, A. S.; Scheu, C.; Gullikson, E. M.; Fischer, S.; Nickel, B. et al.; Kleineberg, U.: Attosecond broadband multilayer mirrors for the water window spectral range. In: Proceedings of SPIE, Vol. 9207, 92070L (Eds. Morawe, C.; Khounsary, A. M.; Goto, S.). Conference on Advances in X-Ray/EUV Optics and Components IX held as part of the SPIE 2014 International Symposium on Optics + Photonics, San Diego, CA, USA, August 18, 2014 - August 20, 2014. (2014)

Cha, L.; Scheu, C.; Dehm, G.: A TEM study of ultra-fine lamellar structures in titanium aluminide. In: 9th Multinational Microscopy Conference 2009 Materials Science, Vol. 3, pp. 247 - 248 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Cha, L.; Scheu, C.; Dehm, G.; Schnitzer, R.; Clemens, H. J.: Initial stages of lamellae formation in high Nb containing γ-TiAl based alloys. In: Materials Research Society Symposium Proceedings 2009, Vol. 1128, pp. 153 - 158. MRS Fall Meeting 2009, Boston, MA, USA, November 30, 2009 - December 04, 2009. (2009)

Rashkova, B.; Zhang, Z.; Šturm, S.; Kothleitner, G.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Scheu, C. et al.; Dehm, G.: EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, pp. 285 - 286 (Ed. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rester, M.; Cha, L.; Scheu, C.; Dehm, G.; Clemens, H. J.; Kothleitner, G.; Leisch, M.: Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, pp. 231 - 232 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)