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Meiners, T.; Duarte, M. J.; Richter, G.; Dehm, G.; Liebscher, C.: Tantalum and Zirconium induced structural transitions at complex [111] tilt grain boundaries in Copper. Acta Materialia 190, pp. 93 - 104 (2020)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: On pinning-depinning and microkink-flow in solid state dewetting: Insights by in-situ ESEM on Al thin films. Acta Materialia 165, pp. 153 - 163 (2019)

Jaya, B. N.; Goto, S.; Richter, G.; Kirchlechner, C.; Dehm, G.: Fracture behavior of nanostructured heavily cold drawn pearlitic steel wires before and after annealing. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 707, pp. 164 - 171 (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Ed. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, August 21, 2017 - August 25, 2017. Universität Regensburg, Regensburg (2017)

Wiederhirn, G.; Balk, T. J.; Dehm, G.; Nucci, J. A.; Richter, G.; Arzt, E.: Passivation Effects in Copper Thin Films. 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden; Germany, September 12, 2005 - September 14, 2005. AIP Conference Proceedings 817, pp. 185 - 191 (2006)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg, Erlangen, Germany (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. 13th Multinational Congress on Microscopy, Rovinj, Croatia (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Microscopy Conference 2017 – Dreiländertagung (MC 2017), Lausanne, Switzerland (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: In-situ observation of irregular void growth in Al thin films during solid state dewetting. 19th International Microscopy Congress (IMC19), Sydney, Australia (2018)