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De Geuser, F.; Gault, B.: Metrology of small particles and solute clusters by atom probe tomography. Acta Materialia 188, pp. 406 - 415 (2020)

Zhao, H.; Huber, L.; Lu, W.; Peter, N. J.; An, D.; De Geuser, F.; Dehm, G.; Ponge, D.; Neugebauer, J.; Gault, B. et al.; Raabe, D.: Interplay of Chemistry and Faceting at Grain Boundaries in a Model Al Alloy. Physical Review Letters 124, 106102 (2020)

Medrano, S.; Zhao, H.; De Geuser, F.; Gault, B.; Stephenson, L.; Deschamps, A.; Ponge, D.; Raabe, D.; Sinclair, C. W.: Cluster hardening in Al-3Mg triggered by small Cu additions. Acta Materialia 161, pp. 12 - 20 (2018)

Zhao, H.; De Geuser, F.; Kwiatkowski da Silva, A.; Szczepaniak, A.; Gault, B.; Ponge, D.; Raabe, D.: Segregation assisted grain boundary precipitation in a model Al–Zn–Mg–Cu alloy. Acta Materialia 156, pp. 318 - 329 (2018)

Zhao, H.; Gault, B.; Ponge, D.; Raabe, D.; De Geuser, F.: Parameter free quantitative analysis of atom probe data by correlation functions: Application to the precipitation in Al–Zn–Mg–Cu. Scripta Materialia 154, pp. 106 - 110 (2018)

De Geuser, F.; Gault, B.: Reflections on the Projection of Ions in Atom Probe Tomography. Microscopy and Microanalysis 23 (2), pp. 238 - 246 (2017)

Langille, M.; Diak, B. J.; De Geuser, F.; Guiglionda, G.; Meddeb, S.; Zhao, H.; Gault, B.; Raabe, D.; Deschamps, A.: Understanding the Role of Cu and Clustering on Strain Hardening and Strain Rate Sensitivity of Al–Mg–Si–Cu Alloys. In: Light Metals 2019, The Minerals, Metals & Materials Series. (MMMS), pp. 143 - 151 (Ed. Chesonis, C.). Springer, Cham (2019)

Zhao, H.; De Geuser, F.; Kwiatkowski da Silva, A.; Szczepaniak, A.; Gault, B.; Ponge, D.; Raabe, D.: Segregation assisted grain boundary precipitation in a model Al–Zn–Mg–Cu alloy. TMS 2018 Annual Meeting & Exhibition, Phoenix, AZ, USA (2018)

Gault, B.; De Geuser, F.; Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Parviainen, S.; Rusitzka, A. K.; Johnson, E.; Sundell, G.; Andersson, M. et al.; Stephenson, L.; Neugebauer, J.; Moody, M. P.; Vurpillot, F.; Raabe, D.: Reconstructing field ion microscopy and atom probe data. Australian Atom Probe Workshop, Magnetic Island, Australia (2017)

Gault, B.; Dagan, M.; Katnagallu, S.; De Geuser, F.; Vurpillot, F.; Raabe, D.; Moody, M. P.: Revisiting Field Ion Microscopy. TMS 2017, San Diego, CA, USA (2017)

Gault, B.; De Geuser, F.: A perspective on the ion projection in field ion & atom probe microscopy. Atom Probe Tomography & Microscopy 2016, Gyeongju, South Korea (2016)