Scientific Events

Room: CM Conference Room Nr. 1174

High-Temperature Scanning Indentation (HTSI): using in-situ nanoindentation to quantify recovery kinetics

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Combining polarized Raman spectroscopy and micropillar compression to study the anisotropic microscale compressive behavior of bone at high strain rates

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Thermoelectric energy conversion - From waste heat to sustainable energy

Thermoelectric materials can convert waste heat into electricity, which is of significant technological and environmental interest. In my talk I will give a short introduction into the field of thermoelectrics including the measurement of the thermoelectric properties of bulk materials at low and elevated temperatures. I will introduce a selection of general concepts, which allow to improve and optimize thermoelectric materials and I will briefly talk about a selection of new directions in the field, where some of them (will) heavily rely on and benefit from the fields of metallurgy and atom probe tomography (e.g. phase boundary mapping and antiphase boundaries as a new route towards low thermal conductivities). [more]

Some Methods and Applications of Data-driven Inference in Materials Science Some Methods and Applications of Data-driven Inference in Materials Science

MPIE Colloquium
Experiments and simulations in materials science and engineering often generate prodigious quantities of data. Extracting information from this data turns out to be more challenging than may at first appear, prompting efforts to create innovative ways of analyzing “big data.” I will provide an overview of my own adventure in data-driven materials research and focus in on a few methods and example applications that have proven to be especially productive. The first deals with the inference of failure criteria for individual microstructure features from databases of individual failure events. The second concerns mining and analysis of image data from the open literature to gain new insight into materials without performing any new experiments or simulations. I will conclude with some thoughts about the future of data-based methods in materials science and engineering. [more]

Advanced AFM based electrical characterization on the nanometer scale

Besides morphological characterization, atomic-force microscopy (AFM) based techniques can also successfully be employed to study electrical and optoelectronic properties on the nanometer scale via conductive atomic-force microscopy (C-AFM) and Kelvin Probe Force Microscopy [1]. This will be demonstrated for dielectric thin films [2] as well as for of individual semiconductor nanostructures like upright standing ZnO nanorods [3,4] polycrystalline ZnO multilayer varistors [5,6], Ge nanodomes [7] and nanostructured graphene flakes [8]. ........................ [1] C. Teichert, I. Beinik, in “Scanning Probe Microscopy in Nanoscience and Nanotechnology”, Vol. 2, Edited by B. Bhushan, (ISBN 978-3-642-10496-1) (Springer-Verlag, Berlin, 2011), pp. 691-721 [2] S. Kremmer, et al. J. Appl. Phys. 67 (2005) 074315. [3] I. Beinik, et al., J. Appl. Phys. 110 (2011) 052005. [4] I. Beinik, et al., Beilstein J. Nanotechnol. 4 (2013) [5] M. Hofstätter, et al., J. Eur. Ceram. Soc. 33 (2013) 3473. [6] A. Nevosad, Proc. SPIE 8626 (2013) 862618. [7] Kratzer, et al., Phys. Rev. B 86 (2012) 245320. [8] B. Vasić, et al., Nanotechnology 24 (2013) 015303. [more]
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