Preprint (11)

141.
Preprint
El-Zoka, A.; Stephenson, L.; Kim, S.-H.; Gault, B.; Raabe, D.: The fate of water in hydrogen-based iron oxide reduction. arXiv (2023)
142.
Preprint
Kang, S. G.; Bellón Lara, B.; Bhaskar, L.; Zhang, S.; Götz, A.; Wirth, J.; Zubiri, B. A.; Kalácska, S.; Jain, M.; Sharma, A. et al.; Koelmans, W.; Schürch, P.; Spiecker, E.; Michler, J. K.; Schwiedrzik, J.; Dehm, G.; Ramachandramoorthy, R.: Fabrication and extreme micromechanics of additive metal microarchitectures. ArXiv (2023)
143.
Preprint
Kim, S.-H.; Yoo, Su, S.-H.; Aota, L. S.; El-Zoka, A.; Kang, P. W.; Lee, Y.; Gault, B.: B dopant evolution in Pd catalysts after H evolution/oxidation reaction in alkaline environment. arXiv (2023)
144.
Preprint
Luo, W.; Tanure, L.; Felten, M.; Nowak, J.; Delis, W.; Freund, M.; Ayeb, N.; Zander, D.; Thomas, C.; Feuerbacher, M. et al.; Sandlöbes-Haut, S.; Korte-Kerzel, S.; Springer, H.: Metallurgical synthesis methods for Mg–Al–Ca scientific model materials. arXiv (2023)
145.
Preprint
Singh, M. P.; Woods, E.; Kim, S.-H.; Jung, C.; Aota, L. S.; Gault, B.: Facilitating the systematic nanoscale study of battery materials by atom probe tomography through in-situ metal coating. arXiv (2023)
146.
Preprint
Tehranchi, A.; Zhang, S.; Zendegani, A.; Scheu, C.; Hickel, T.; Neugebauer, J.: Metastable defect phase diagrams as a tool to describe chemically driven defect formation: Application to planar defects. arXiv (2023)
147.
Preprint
Woods, E.; Saksena, A.; El-Zoka, A.; Stephenson, L.; Schwarz, T.; Singh, M. P.; Aota, L. S.; Kim, S.-H.; Schneider, J. M.; Gault, B.: Nanoporous gold thin films as substrates to analyze liquids by cryo-atom probe tomography. arXiv (2023)
148.
Preprint
Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani , F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. arXiv (2023)
149.
Preprint
Zhou, X.; Mathews, P.; Berkels, B.; Ahmad, S.; Alhassan, A. S. A.; Keuter, P.; Schneider, J. M.; Raabe, D.; Neugebauer, J.; Dehm, G. et al.; Hickel, T.; Scheu, C.; Zhang, S.: Constructing phase diagrams for defects by correlated atomic-scale characterization. arXiv (2023)
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