Talk (14)

41.
Talk
Isotta, E.; Wynnychenko, R.; Mukherjee, B.; Kaman, J.; Sahasrabuddhe, H.; Zheng, J.; Jain, A.; Hautier, G.; Zevalkink, A.; Musterman, E. et al.; Dierolf, V.; Jain, H.; Snyder, G. J.; Balogun, O.: Distinguishing amorphous and anisotropic heat transport in Sb2S3 via thermal conductivity imaging. MRS Spring Meeting 2025, Seattle, WA, USA (2025)
42.
Talk
Isotta, E.: Local thermal conductivity imaging and modelling to guide microstructure engineering in energy materials. TMS 2025 Annual Meeting, Las Vegas, NV, USA (2025)
43.
Talk
Joo, M.; Xiu, H.; Cheng, N.; Somsen, C.; Baha, S.; Ludwig, A.; Li, Y.; Kostka, A.; Scheu, C.: Revealing relations between structural complexity and electrocatalytic activity in Au–Pd–Pt–Ru compositionally complex solid solution thin films. The 2025 Materials Research Society (MRS) Fall Meeting & Exhibit, Boston, MA, USA (2025)
44.
Talk
Zhang, S.; Yu, Y.; Ying, P.; Jung, C.; Mattlat, D. A.; Scheu, C.: Operando microscopy on thermoelectric materials–Measuring electrical and thermal transport on MEMS chips. Microscopy Conference (MC) 2025, Karlsruhe, Germany (2025)

Poster (4)

45.
Poster
Joo, M.; Xiu, H.; Cheng, N.; Somsen, C.; Baha, S.; Ludwig, A.; Li, Y.; Kostka, A.; Scheu, C.: Structural analysis of Au-Pd-Pt-Ru compositionally complex solid solution thin films using 4D-STEM. Women in Electron Microscopy, Jülich, Germany (2025)
46.
Poster
Kanjilal, A.; Bhat, M. K.; Duarte, M. J.; Shashkov, P.; Usov, S.; Fanicchia, F.; Beucher, L.; Busch, H.; Scheu, C.; Dehm, G.: Investigation of Al2O3 coating deposited on Al alloy by electrochemical oxidation for hydrogen permeation barrier applications. SteelyHydrogen Conference, Ghent, Belgium (2025)
47.
Poster
Busch, F.; Balogun, O.; Snyder, G. J.; Scheu, C.; Isotta, E.: Unravelling grain boundary influences on electronic and lattice thermal conductivity in Mn-doped SnTe thermoelectrics. 21st European Conference on Thermoelectrics (ECT) 2025, Nancy, Frankreich (2025)
48.
Poster
Mattlat, D. A.; Jung, C.; Ying, P.; Li, J.; He, S.; Bahrami, A.; Zhang, S.; Scheu, C.: New method of FIB TEM sample preparation for in situ heating and biasing MEMS chip used for investigation on Zn4Sb3 thermoelectric material. Microscopy Conference (MC) 2025, Karlsruhe, Germany (2025)
Go to Editor View