Advanced geometric analysis of EBSD patterns

Backscatter Kikuchi diffraction patterns (or EBSD patterns) contain much more information about the diffracting crystal than just the crystal orientation. In particular, they carry information about the crystal metrik and about the density of defects at the illuminated area. The crystal metrik (i.e. the lattice parameters) can be determined from an exact analysis of the band position. Information on the defect density is obtained from an analysis of the band profile.

Left: a backscatter Kikuchi pattern (Fe-Ni, 15 kV) Right: the Fourier transform of the pattern. The position of the Kikuchi bandlet filter is marked in red.

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