Journal Article
            Douglas, J.; Conroy, M.; Giuliani, F.; Gault, B.:  In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam. Microscopy and Microanalysis 
29 (3), pp. 1009 - 1017 (2023)