Home News Press Releases MPIE material testers are the best in NRW Publications of Kumaresh K. Rajan All genres Journal Article (1) Journal Article (1) 1. Journal Article Cairney, J. M.; Rajan, K. K.; Haley, D.; Gault, B.; Bagot, P. A. J.; Choi, P.-P.; Felfer, P. J.; Ringer, S. P.; Marceau, R. K. W.; Moody, M. P.: Mining information from atom probe data. Ultramicroscopy 159, pp. 324 - 337 (2015) MPG.PuRe DOI