Archie, F. M. F.; Zaefferer, S.: Micro-damage initiation in advanced high strength steels (AHSS): Influence of Prior Austenite Grain Boundaries. Meeting Materials 2016 - M2i - Materials innovation institute, Nieuwegein, The Netherlands (2016)
Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Port Elizabeth, South Africa (2016)
Stechmann, G.; Zaefferer, S.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Hamburg, Germany (2015)
Zaefferer, S.; Zhu, Z.; Reed, R. C.: Observation of Dislocation Evolution during Straining of a γ-γ’ Superalloy Single Crystal using the CECCI technique. Eurosuperalloys 2014, Giens, France (2014)
Archie, F. M. F.; Zaefferer, S.; Raabe, D.: The influence of grain boundary character on dislocation densities and fracture toughness in AHSS. M2i Conference "High Tech Materials: your world - our business", Sint Michielgestel, The Netherlands (2014)
Ram, F.; Zaefferer, S.: Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method. IMC 2014, Prague, Czech Republic (2014)
Ram, F.; Zaefferer, S.: Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method. MSE 2014, Darmstadt, Germny (2014)
Ram, F.; Zaefferer, S.; Jäpel, T.: Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method. RMS EBSD 2014, London, UK (2014)
Ram, F.; Zaefferer, S.; Jäpel, T.: On the accuracy and precision of orientations obtained by the conventional automated EBSD method. RMS EBSD 2014, London, UK (2014)
Zaefferer, S.; Mandal, S.; Stechmann, G.; Bozzolo, N.: Correlative measurement of the 5-parameter grain boundary character and its physical and chemical properties. RMS EBSD 2014, London, UK (2014)
Ram, F.; Zaefferer, S.: Kikuchi Bandlet Method: A Method to Resolve the Source Point Position of an EBSD Pattern. 15th European Microscopy Congress (EMC), Manchester, UK (2012)