Arigela, V. G.; Oellers, T.; Ludwig, A.; Kirchlechner, C.; Dehm, G.: Mechanical characterization of copper thin films produced by photolithography with a novel microscale high temperature loading rig. The International Conference on Experimental Mechanics, (ICEM) 2018, Brussels, Belgium (2018)
Li, J.; Dehm, G.; Kirchlechner, C.: Dislocation source activation by nanoindentation in single crystals and at grain boundaries. E-MRS Spring, Strasbourg, France (2018)
Li, J.; Dehm, G.; Kirchlechner, C.: Differences in dislocation source activation stress in the grain interior and at twin boundaries using nanoindentation. Nanobruecken 2018, Erlangen, Germany (2018)