Conference Paper
Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)