Publications of Christina Scheu

Gopalan, H.; Rao, J.; Patil, P.; Jung, C.; Kim, S.-H.; Wolff-Goodrich, S.; Wetegrove, M.; Kruth, A.; Scheu, C.; Dehm, G. et al.; Duarte, M. J.: Influence of electrochemical hydrogen charging on the mechanical, diffusional, and interfacial properties of an amorphous alumina coating on Fe‑8 wt% Cr alloy. Journal of Materials Research 39, pp. 1812 - 1821 (2024)

Felten, M.; Chaineux, V.; Zhang, S.; Tehranchi, A.; Hickel, T.; Scheu, C.; Spille, J.; Lipińska-Chwałek, M.; Mayer, J.; Berkels, B. et al.; Hans, M.; Greving, I.; Flenner, S.; Sefa, S.; Zander, D.: The effect of Laves phases and nano-precipitates on the electrochemical corrosion resistance of Mg–Al–Ca alloys under alkaline conditions. Journal of Magnesium and Alloys 12 (6), pp. 2447 - 2461 (2024)

Yu, Y.; Sheskin, A.; Wang, Z.; Uzhansky, A.; Natanzon, Y.; Dawod, M.; Abdellaoui, L.; Schwarz, T.; Scheu, C.; Wuttig, M. et al.; Cojocaru-Mirédin, O.; Amouyal, Y.; Zhang, S.: Ostwald Ripening of Ag₂Te Precipitates in Thermoelectric PbTe: Effects of Crystallography, Dislocations, and Interatomic Bonding. Advanced Engineering Materials 14 (19), 2304442 (2024)

Jang, K.; Kim, M.-Y.; Jung, C.; Kim, S.-H.; Choi, D.; Park, S.-C.; Scheu, C.; Choi, P.-P.: Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1047 - 1056 (2024)

Cheraparambil, H.; Vega-Paredes, M.; Scheu, C.; Weidenthaler, C.: Unraveling the Evolution of Dynamic Active Sites of LaNi_xFe_1-xO₃ Catalysts During OER. ACS Applied Materials & Interfaces 16 (17), pp. 21997 - 22006 (2024)

Onur, E.; Lee, J.; Aymerich-Armengol, R.; Lim, J.; Dai, Y.; Tüysüz, H.; Scheu, C.; Weidenthaler, C.: Exploring the Effects of the Photochromic Response and Crystallization on the Local Structure of Noncrystalline Niobium Oxide. ACS Applied Materials & Interfaces 16 (19), pp. 25136 - 25147 (2024)

Hieke, S. W.; Frank, A.; Duarte, M. J.; Gopalan, H.; Patil, P.; Wetegrove, M.; Rohloff, M.; Kruth, A.; Pistidda, C.; Dornheim, M. et al.; Taube, K.; Dehm, G.; Scheu, C.: Stability and Failure Mechanisms of Al₂O₃|Al Bilayer Coatings Exposed to 300 Bar Hydrogen at 673 K. Advanced Engineering Materials 26 (4), 2300619 (2024)

Neuß, D.; McCaroll, I.; Zhang, S.; Woods, E.; Delis, W. J.; Tanure, L.; Springer, H.; Sandlöbes, S.; Yang, J.; Todorova, M. et al.; Zander, D.; Scheu, C.; Schneider, J. M.; Hans, M.: High-resolution chemical and structural characterization of the native oxide scale on a Mg-based alloy. Corrosion Science 227, 111776 (2024)

Aymerich Armengol, R.; Vega-Paredes, M.; Wang, Z.; Mingers, A. M.; Camuti, L.; Kim, J.; Bae, J.; Efthimiopoulos, I.; Sahu, R.; Podjaski, F. et al.; Rabe, M.; Scheu, C.; Lim, J.; Zhang, S.: Operando Insights on the Degradation Mechanisms of Rhenium-Doped and Undoped Molybdenum Disulfide Nanocatalysts During Hydrogen Evolution Reaction and Open-Circuit Conditions. Advanced Functional Materials 35 (3), 2413720 (2024)

Cheraparambil, H.; Vega-Paredes, M.; Wang, Y.; Tüysüz, H.; Scheu, C.; Weidenthaler, C.: Deciphering the role of Fe impurities in the electrolyte boosting the OER activity of LaNiO3. Journal of Materials Chemistry A 12 (9), pp. 5194 - 5203 (2024)

Geng, X.; Vega-Paredes, M.; Lu, X.; Chakraborty, P.; Li, Y.; Scheu, C.; Wang, Z.; Gault, B.: Concave Grain Boundaries Stabilized by Boron Segregation for Efficient and Durable Oxygen Reduction. Advanced Materials, 2404839 (2024)

Knezevic, M.; Hoang, T.-H.; Wang, C.; Johar, M.; Manjón, A. G.; Rauret, D. L.; Scheu, C.; Erard, M.; Berardan, D.; Arbiol, J. et al.; Colbeau-Justin, C.; Ghazzal, M. N.: Amplified Photoluminescence of CsPbX3 Perovskites Confined in Silica Film with a Chiral Nematic Structure. Advanced Materials Interfaces 11 (3), 2300636 (2024)

Ying, P.; Bueno Villoro, R.; Bahrami, A.; Wilkens, L.; Reith, H.; Mattlat, D. A.; Pacheco, V.; Scheu, C.; Zhang, S.; Nielsch, K. et al.; He, R.: Performance Degradation and Protective Effects of Atomic Layer Deposition for Mg-based Thermoelectric Modules. Advanced Functional Materials 34 (45), 2406473 (2024)

Choi, J.; Yoo, S.; Koh, E. S.; Aymerich-Armengol, R.; Scheu, C.; Fortunato, G. V.; Lanza, M. R. V.; Hwang, Y. J.; Ledendecker, M.: Unlocking the Potential of Sub-Nanometer Pd Catalysts for Electrochemical Hydrogen Peroxide Production. Advanced Materials Interfaces 10 (36), 2300647 (2023)

Jung, C.; Jang, K.; Park, H.; Jang, J.; Jang, H.; Kang, B.; Park, K.; Zhang, S.; Bueno Villoro, R.; Park, S. et al.; Ryu, H. J.; Jung, Y. S.; Oh, M.-W.; Scheu, C.; Yi, S.-H.; Choi, P.-P.: Enhanced thermoelectric properties of NbCoSn half-Heuslers through in-situ nanocrystallization of amorphous precursors during the consolidation process. Journal of Materials Science & Technology 165, pp. 39 - 48 (2023)

Rivas Rivas, N. A.; Garzón-Manjón, A.; Vega-Paredes, M.; Kim, S.-H.; Gault, B.; Jun, H.; Jung, C.; Berova, V.; Hengge, K.; Jurzinsky, T. et al.; Scheu, C.: Chemistry and microstructure of C-supported Ru catalyst nanoparticles: A correlative study. Ultramicroscopy 254, 113831 (2023)

Ai, X.; Lei, B.; Cichocka, M. O.; Giebeler, L.; Bueno Villoro, R.; Zhang, S.; Scheu, C.; Pérez, N.; Zhang, Q.; Sotnikov, A. et al.; Singh, D. J.; Nielsch, K.; He, R.: Enhancing the thermoelectric properties via modulation of defects in p-type MNiSn-based (M = Hf, Zr, Ti) half-Heusler materials. Advanced Functional Materials 33 (48), 2305582 (2023)

Park, Y.; Lee, C.; Choi, J.; Kang, P. W.; Scheu, C.; Lee, H. M.; Choi, P.-P.; Jung, C.: The interfaces of Ag-rich and Cu-rich AgCu phases boost oxygen reduction activity. Applied Surface Science 637, 157949 (2023)

Bueno Villoro, R.; Naderloo, R. H.; Mattlat, D. A.; Jung, C.; Nielsch, K.; Scheu, C.; He, R.; Zhang, S.: Composite design of half-Heusler thermoelectrics: Selective doping of grain boundary phases in NbFeSb by InSb. Materials Today Physics 38, 101240 (2023)

Sahu, R.; Bogdanovski, D.; Achenbach, J.-O.; Hans, M.; Primetzhofer, D.; Schneider, J. M.; Scheu, C.: Compositional defects in a MoAlB MAB phase thin film grown by high-power pulsed magnetron sputtering. Nanoscale 15 (43), pp. 17356 - 17363 (2023)