Conference Paper
Peng, Z.; Gault, B.; Raabe, D.; Ashton, M. W.; Sinnott, S. B.; Choi, P.-P.; Li, Y.: On the Multiple Event Detection in Atom Probe Tomography. In: MicroscopyMicroanalysis, Vol.
23, pp. 618 - 619. Microscopy & Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. (2017)