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Book (26)

4281.
Book
Krüger, T.: Computer simulation study of collective phenomena in dense suspensions of red blood cells under shear. Springer Spektrum, Heidelberg (2012), 165 pp.
4282.
Book
Dehm, G.; Zweck, J.: In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley VCH Verlag, Weinheim, Germany (2012)
4283.
Book
Alkauskas, A.; Deak, P.; Neugebauer, J.; Pasquarello, A.; van de Walle, C. G. (Eds.): Advanced Calculations for Defects in Materials: Electronic Structure Methods. WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany (2011), 384 pp.
4284.
Book
Race, C. P.: The Modelling of Radiation Damage in Metals Using Ehrenfest Dynamics. Springer-Verlag Berlin / Heidelberg, Germany (2010), 303 pp.
4285.
Book
Roters, F.; Eisenlohr, P.; Bieler, T. R.; Raabe, D.: Crystal Plasticity Finite Element Methods in Materials Science and Engineering. Wiley-VCH, Weinheim (2010), 197 pp.
4286.
Book
Boeck, S.: Development and Application of the S/PHI/nX Library. Südwestdeutscher Verlag für Hochschulschriften, Saarbrücken, Germany (2009), 164 pp.
4287.
Book
Mudali, U. K.; Rai, B.: Corrosion Science and Technology: Mechanism, Mitigation and Monitoring. CRC; 1 edition (November 20, 2008) (2008), 586 pages pp.
4288.
Book
Hassel, A. W.; Bonk, S.; Wicinski, M.; Stratmann, M.; Ogle, K.; Philips-Falcey, N.; Ostwald, C.; Janssen, S.; Stellnberger, K.-H.; Konrath, P.: Passive/active transistions in cyclic corrosion tests. Office for Official Publications of the European Communities, Luxembourg, Luxembourg (2007)
4289.
Book
Janssens, K. G. F.; Raabe, D.; Kozeschnik, E.; Miodownik, M. A.; Nestler, B.: Computational Materials Engineering – An Introduction to Microstructure Evolution. Academic Press, Elsevier, USA (2007), 360 pp.
4290.
Book
Winning, M.: Korngrenzen auf Wanderschaft – Wege zum Design metallischer Werkstoffe. Franz Steiner Verlag, Stuttgart [Germany] (2007), 34 pp.
4291.
Book
Hildebrandt, S.; Lymperakis, L.; Neugebauer, J.; Stutzmann, M. (Eds.): Proceedings of the 6th International Conference of Nitride Semiconductors. Wiley-VCH - physica status solidi, Weinheim, Germany (2006), 203 pp.
4292.
Book
Raabe, D.; Roters, F.; Barlat, F.; Chen, L.-Q. (Eds.): Continuum Scale Simulation of Engineering Materials Fundamentals - Microstructures - Process Applications. WILEY-VCH, Weinheim (2004), 855 pp.
4293.
Book
Bard, A. J.; Stratmann, M. (Eds.): Encyclopaedia of Electrochemistry. Wiley-VCh, Weinheim, Germany (2003), 10 Volumes pp.
4294.
Book
Bard, A. J.; Stratmann, M. (Eds.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4295.
Book
Bard, A. J.; Stratmann, M. (Eds.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4296.
Book
Bard, A. J.; Stratmann, M. (Eds.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4297.
Book
Bard, A. J.; Stratmann, M. (Eds.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4298.
Book
Bard, A. J.; Stratmann, M. (Eds.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4299.
Book
Bard, A. J.; Stratmann, M. (Eds.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4300.
Book
Bard, A. J.; Stratmann, M. (Eds.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
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