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Schuhmacher, B.; Müschenborn, W.; Stratmann, M.; Schultrich, B.; Klages, C. P.; Kretschmer, M.; Seyfert, U.; Forster, F.; Tiller, H. J.: Novel coating systems and surface technologies for continuous processing of steel sheet. Advanced Engineering Materials 3, pp. 681 - 689 (2001)

Seo, M.; Aihara, M.; Hassel, A. W.: Cathodic Decomposition and Anodic Dissolution and Changes in Surface Morphology of n-type InP in HCl. J. Electrochem. Soc. 148, pp. B400 - B404 (2001)

Stein, F.; Zhang, L.; Sauthoff, G.; Palm, M.: TEM and DTA Study on the Stability of Al₅Ti₃- and h-Al₂Ti-Superstructures in Aluminium-Rich TiAl Alloys. Acta Materialia 49 (15), pp. 2919 - 2932 (2001)

Tôkei, Z. S.; Grabke, H.-J.: Diffusion of ⁵¹Cr in a cold-rolled 18Cr8Ni-steel. Defect and Diffusion Forum 194-199, pp. 1239 - 1246 (2001)

Varnik, F.; Scheidler, P.; Baschnagel, J.; Kob, W.; Binder, K.: Molecular Dynamics Simulation of Confined Glass forming Liquids. Material Research Society Proc. 651 (T3.1.1) (2001)

Zhao, Z.; Roters, F.; Mao, W.; Raabe, D.: Introduction of a texture component crystal plasticity finite element method for anisotropy simulations. Advanced Engineering Materials 3, pp. 984 - 990 (2001)

Roters, F.; Raabe, D.; Gottstein, G.: Work hardening in heterogeneous alloys - A microstructural approach based on three internal state variables. Acta Materialia 48 (17), pp. 4181 - 4189 (2000)

Zhang, D.; Dehm, G.; Clemens, H.: On the microstructural evolution and phase transformation in a high niobium containing γ-TiAl alloy. Zeitschrift für Metallkunde 91 (11), pp. 950 - 956 (2000)

Marketz, W. T.; Fischer, F. D.; Kauffmann, F.; Dehm, G.; Bidlingmaier, T.; Wanner, A.; Clemens, H.: Computational modeling and experimental study of the deformation behaviour of γ-TiAl based alloys. Advanced Engineering Materials 2 (10), pp. 662 - 666 (2000)

Chatterjee, A.; Dehm, G.; Scheu, C.; Clemens, H.: Onset of microstructural instability in a fully lamellar Ti-46.5 at.% Al-4 al.% (Cr,Nb,Ta,B) alloy during short-term creep. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 91 (9), pp. 755 - 760 (2000)

Dehm, G.; Arzt, E.: In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate. Applied Physics Letters 77 (8), pp. 1126 - 1128 (2000)

Kauffmann, F.; Bidlingmaier, T.; Dehm, G.; Wanner, A.; Clemens, H.: On the origin of acoustic emission during room temperature compressive deformation of a γ-TiAl based alloy. Intermetallics 8 (7), pp. 823 - 830 (2000)

Fili, T.; Rohwerder, M.; Stratmann, M.: Influence of Surface Plasma Pretreatment on the Interface Properties of a-SiC:H-Covered Steel Substrates. Advanced Engineering Materials 2, 6, pp. 378 - 380 (2000)

Zhang, D.; Dehm, G.; Clemens, H.: Effect of heat treatments and hot-isostatic pressing on phase transformations and microstructure in a β/B2 containing γ-TiAl based alloy. Scripta Materialia 42 (11), pp. 1065 - 1070 (2000)

Grundmeier, G.; Schmidt, W.; Stratmann, M.: Corrosion protection by organic coatings: Electrochemical mechanism and novel methods of investigation. Electrochimica Acta 45 (15-16), pp. 2515 - 2533 (2000)

Fürbeth, W.; Stratmann, M.: Scanning Kelvin Probe investigations on the delamination of polymeric coatings from metallic surfaces. Progress in Organic Coatings 39 (1), pp. 23 - 29 (2000)

Gerthsen, D.; Rosenauer, A.; Litvinov, D.; Peranio, N.: Structural and chemical analysis of CdSe islands in a ZnSe matrix by transmission electron microscopy. Journal of Crystal Growth 214/215, 707 (2000)

Grabke, H. J.; Müller-Lorenz, E. M.; Eltester, B.; Lucas, M.: Formation of chromium rich oxide scales for protection against metal dusting. Materials at High Temperatures 17 (2), pp. 339 - 345 (2000)

Hassel, A. W.; Aihara, M.; Seo, M.: Formation and corrosion of InP/In contacts in hydrochloric acid. Electrochim. Acta 45, pp. 4673 - 4682 (2000)

Kowalik, T.; Adler, H. J. P.; Plagge, A.; Stratmann, M.: Ultrathin layers of phosphorylated cellulose derivatives on aluminium surfaces. Macromolecular Chemistry & Physics 201, 15, pp. 2064 - 2069 (2000)