- Scanning electron microscopy (SEM) and site specific TEM sample preparation by Focused ion beam (FIB)
- Transmission electron microscopy (TEM) methods, including conventional
TEM, high-resolution TEM, scanning TEM and electron energy loss spectroscopy
- Thermoelectric materials
01/11/2015- present : Max-Planck-Institut für
Eisenforschung GmbH, PhD student in the Nanoanalytics and Interfaces group of Prof.
01/04/2015-01/10/2015: Delft University of Technology, Faculty 3mE, Department of Biomechanical Engineering, The vision based robotics group. The Netherlands, Master thesis in 3D Reproduction of fine arts “painting by Van Gogh” in the group of Pr.Dr.ir. Pieter Jonker.
01/10/2013-07/07/2015: Faculty of Science and Technology –Mohammedia,University HASSAN II of Casablanca, Morocco,Master Program in Physical Chemistry and Materials Analysis.
01/10/2008-17/07/2012: Faculty of Science and Technology-Marrakech,University CADI AYYAD of Marrakech, Morocco, Bachelor Program in Physical Chemistry of Materials.