Scientific Events

Speaker: Dr. Oleg Prymak

Investigation of Nanostructural Materials by means of X-Ray Powder Diffraction

Investigation of Nanostructural Materials by means of X-Ray Powder Diffraction
Nanostructured materials represent a well-established part of nanoscience today due to their tunable electrical, optical, magnetic and catalytic properties, and their potential in nanomedicine. There are some common techniques used for the investigation of nanomaterials, e.g. light scattering (DLS and NTA), scanning and transmission electron microscopy (SEM and TEM), fluorescence and IR spectroscopy and many others. X-ray powder diffraction (PXRD) with different geometrical setups is a complementary non-destructive technique for the determination of crystallographic and size-related properties of nanostructured materials. Here, some examples of PXRD measurements in different applications with the use of Rietveld analysis, including size-specific data obtained from colloid-chemical analysis, transmission and scanning electron microscopy will be presented. Several scientific questions will be addressed, like: - How can crystallite size, residual stress and texture be determined for nanostructured materials? - How is it possible to investigate a thin coating of nanomaterials? - Which advantages does a characterization of samples in temperature chamber offer? It will be shown that the non-destructive X-ray method is well suited to describe not only the crystallographic properties of nanostructural materials, but also their size, shape and inner structure with a possible atomic substitution as well as their “nano”-orientation on the surface. All these scientific answers can be received by the use of different X-ray diffractometers such Bruker D8 Advance and Panalytical Empyrean available at the facility for X-ray Diffraction of the University of Duisburg-Essen. [more]
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