Awards at the Microscopy and Microanalysis 2017 Meeting

August 15, 2017

Three doctoral students from the department “Microstructure Physics and Alloy Design” at the Max-Planck-Institut für Eisenforschung (MPIE) were awarded various prizes at the “Microscopy and Microanalysis 2017 Meeting” (M&M), which took place from the 6^th to the 9^th of August in St. Louis, USA. Philipp Kürnsteiner, doctoral student in the group “Alloys for Additive Manufacturing” won the M&M Student Paper Award 2017, which is annually given to students by the Microanalysis Society. Shyam Katnagallu and Zirong Peng, both doctoral students in the group “Atom Probe Tomography”, were awarded with the IFES Student Award by the “International Field Emission Society”. Each prize is endowed with 1000 U.S. dollars for covering the travel expenses and the conference fee. This prize is supposed to give young scientists the chance to present their research to the materials science community. Furthermore, Peng won the Best Poster Award for her poster on the “Methodology for high resolution direct study of grain boundary diffusion, segregation and precipitation”.

Shyam Katnagallu, Zirong Peng and Philipp Kürnsteiner (from the left), doctoral students at the MPIE, won various awards at the “Microscopy and Microanalysis 2017 Meeting” (M&M), which took place from the 6th to the 9th of August in St. Louis, USA. — Shyam Katnagallu, Zirong Peng and Philipp Kürnsteiner (from the left), doctoral students at the MPIE, won various awards at the “Microscopy and Microanalysis 2017 Meeting” (M&M), which took place from the 6^th to the 9^th of August in St. Louis, USA.

© Torsten Schwarz, Max-Planck-Institut für Eisenforschung GmbH

Shyam Katnagallu, Zirong Peng and Philipp Kürnsteiner (from the left), doctoral students at the MPIE, won various awards at the “Microscopy and Microanalysis 2017 Meeting” (M&M), which took place from the 6^th to the 9^th of August in St. Louis, USA.

© Torsten Schwarz, Max-Planck-Institut für Eisenforschung GmbH

The M&M is an annual conference sponsored by the Microscopy Society of America, the Microanalysis Society and, for the first time, by the International Field Emission Society to celebrate the 50th anniversary of the atom probe technique. Three special symposia on atom probe were organised, with invited contributions from some of the pioneers of the technique. The MPIE had a strong representation with five oral presentations and Dr. Baptiste Gault, leader of the MPIE’s “Atom Probe Tomography” group, chair of one symposium.