Betzler, S. B.; Wisnet, A.; Breitbach, B.; Mitterbauer, C.; Weickert, J.; Schmidt-Mende, L.; Scheu, C.: Template-free synthesis of novel, highly-ordered 3D hierarchical Nb₃O₇(OH) superstructures with semiconductive and photoactive properties. Journal of Materials Chemistry A 2 (30), pp. 12005 - 12013 (2014)

Guggenmos, A.; Raduenz, S.; Rauhut, R.; Hofstetter, M.; Venkatesan, S.; Wochnik, A. S.; Gullikson, E. M.; Fischer, S.; Nickel, B.; Scheu, C. et al.; Kleineberg, U.: Ion polished Cr/Sc attosecond multilayer mirrors for high water window reflectivity. Optics Express 22 (22), pp. 26526 - 26536 (2014)

Clemens, H.; Mayer, S.; Scheu, C.: Microstructure and Properties of Engineering Materials. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, pp. 3 - 20 (Eds. Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Ed. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, August 21, 2017 - August 25, 2017. Universität Regensburg, Regensburg (2017)

Folger, A.; Wisnet, A.; Scheu, C.: Defects in as-grown vs. annealed rutile titania nanowires and their effect on properties. EMC 2016, 16th European Microscopy Congress, Lyon, France, August 28, 2016 - September 02, 2016. European Microscopy Congress 2016: Proceedings, pp. 409 - 410 (2016)

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, pp. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, August 28, 2016 - September 02, 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol. 22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)

Berova, V.; Garzón-Manjón, A.; Vega-Paredes, M.; Scheu, C.; Jurzinsky, T.: Influence of Shell Thickness on Durability of Ru@Pt Core-Shell Catalysts for Reformate PEM Fuel Cells. In ECS Meeting Abstracts, MA2022-01 (35), p. 1528. The Electrochemical Society (2022)

Scheu, C.; Bueno Villoro, R.; Abdellaoui, L.; Mattlat, D. A.; Jung, C.; Gault, B.; Zhang, S.: New insights into thermoelectric materials through length-bridging characterization. Transverse Effects in Thermoelectric Systems 819. WE-Heraeus-Seminar, Bad Honnef, Germany (2024)

Zhang, S.; Zhou, X.; Ahmad, S.; Dehm, G.; Scheu, C.: Triggering and tracking grain boundary phase transformation at atomic resolution. European Microscopy Conference EMC 2024, Copenhagen, Denmark (2024)

Scheu, C.: Unlocking the Stability of Ceramics in (Photo)Electro-Chemical Application and the Role of Defects. Gordon Research Conference on Solid State Studies in Ceramics at the Mount Holyoke College, South Hadley, MA, USA (2024)

Zhang, S.; Yu, Y.; Jung, C.; Mattlat, D. A.; Abdellaoui, L.; Scheu, C.: In situ STEM observation of thermoelectric materials under heating and biasing conditions. The 6th joint Sino-German workshop on advanced & correlative electron microscopy of catalysts, quantum phenomena & soft matter, Bad Honnef, Germany (2024)

Scheu, C.: Insight in defects of energy materials: Aberration corrected STEM imaging coupled with 3D atom probe tomography. Colloquium Ludwig-Maximilians-Universität, München, Germany (2024)

Zhang, S.; Yu, Y.; Jung, C.; Wang, Z.; Mattlat, D. A.; Abdellaoui, L.; Scheu, C.: In situ microstructural observation and electrical transport measurements of PbTe thermoelectrics by transmission electron microscopy. International Conference on Thermoelectrics ICT, Krakow, Poland (2024)

Scheu, C.: Electron Energy-Loss Spectroscopy in a Scanning Transmission Electron Microscope: A versatile tool to study bonding characteristics in materials. Atom Probe Tomography: A local probe of chemical bonds in solids?, Aachen, Germany (2024)

Aota, L. S.; Jung, C.; Zhang, S.; Büyükuslu, Ö.; Singh, M. P.; Chen, X.; Woods, E.; Scheu, C.; Kim, S.-H.; Raabe, D. et al.; Gault, B.: Grain boundary-controlled lithiation of Li-solid solution systems for lithium metal batteries. International Operando Battery Days, Grenoble, France (2024)

Bellón Lara, B.; Bhaskar, L.; Sonawane, S.; Brink, T.; Aymerich-Armengol, R.; Chatain, D.; Dehm, G.; Ramachandramoorthy, R.: Compression of dewetted Nickel microparticles at ultra-high strain rates. 19th European Mechanics of Materials Conference, Madrid, Spain (2024)

Cheng, N.; Sun, H.; Pivak, Y.; Liebscher, C.: In situ liquid phase 4D-STEM provides quantitative insights into the phase evolution of nanostructured Cu under electrochemical conditions. 15th International Conference on Atomically Controlled Surfaces, Interfaces, and Nanostructures, Suzhou, China (2024)

Zhang, S.: Multivariate statistical analysis using Hyperspy. Electron Microscopy Spring School 2024, Berlin, Germany (2024)

Scheu, C.: Spectroscopy. Electron Microscopy Spring School of the yDGE, Berlin, Germany (2024)