Publikationen von Christina Scheu

Lazar, P.; Rashkova, B.; Redinger, J.; Podloucky, R.; Mitterer, C.; Scheu, C.; Dehm, G.: Interface structure of epitaxial (111) VN films on (111) MgO substrates. Thin Solid Films 517 (3), S. 1177 - 1181 (2008)

Cha, L.; Scheu, C.; Clemens, H.; Chladil, H. F.; Dehm, G.; Gerling, R. W.; Bartels, A.: Nanometer-scaled lamellar microstructures in Ti–45Al–7.5Nb–(0; 0.5)C alloys and their influence on hardness. Intermetallics 16 (7), S. 868 - 875 (2008)

Lazar, P.; Redinger, J.; Strobl, J.; Podloucky, R.; Rashkova, B.; Dehm, G.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C. et al.; Scheu, C.: N–K electron energy-loss near-edge structures for TiN/VN layers: an ab initio and experimental study. Analytical and Bioanalytical Chemistry 390 (6), S. 1447 - 1453 (2008)

Rashkova, B.; Lazar, P.; Redinger, J.; Podloucky, R.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C.; Scheu, C.; Dehm, G.: Combined ab-initio and N–K, Ti-L_2,3, V-L_2,3 electron energy-loss near edge structure studies for TiN and VN films. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 98 (11), S. 1060 - 1065 (2007)

Dehm, G.; Motz, C.; Scheu, C.; Clemens, H. J.; Mayrhofer, P. H.; Mitterer, C.: Mechanical size-effects in miniaturized and bulk materials. Advanced Engineering Materials 8 (11), S. 1033 - 1045 (2006)

Scheu, C.; Gao, M.; Oh, S. H.; Dehm, G.; Klein, S.; Tomsia, A.; Rühle, M.: Bonding at copper-alumina interfaces established by different surface treatments: a critical review. Journal of Materials Science 41 (16), S. 5161 - 5168 (2006)

Wetscher, F.; Pippan, R.; Šturm, S.; Kauffmann, F.; Scheu, C.; Dehm, G.: TEM investigation of the structural evolution in a pearlitic steel deformed by high pressure torsion. Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science 37 (6), S. 1963 - 1968 (2006)

Clemens, H.; Schubert, D. W.; Dehm, G.; Scheu, C.; Buttstaedt, J. L.: Characterization of biocompatible Ti(CNO) layers on polymeric substrates. Applied Surface Science 219 (3-4), S. 329 - 337 (2003)

Scheu, C.; Dehm, G.; Kaplan, W. D.: Equilibrium amorphous silicon-calcium-oxygen films at interfaces in copper-alumina composites prepared by melt infiltration. Journal of the American Ceramic Society 84 (3), S. 623 - 630 (2001)

Chatterjee, A.; Dehm, G.; Scheu, C.; Clemens, H.: Onset of microstructural instability in a fully lamellar Ti-46.5 at.% Al-4 al.% (Cr,Nb,Ta,B) alloy during short-term creep. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 91 (9), S. 755 - 760 (2000)

Scheu, C.; Dehm, G.; Kaplan, W. D.; García, D. E.; Claussen, N. E.: Microstructure of alumina composites containing niobium and niobium aluminides. Journal of the American Ceramic Society 83 (2), S. 397 - 402 (2000)

Dehm, G.; Scheu, C.; Bamberger, M. S.: Microstructure of Iron Substrates Borided with Ni₂B Particles by Laser-Induced Surface-Alloying. Zeitschrift für Metallkunde 90 (11), S. 920 - 929 (1999)

Dehm, G.; Medres, B. S.; Shepeleva, L.; Scheu, C.; Bamberger, M. S.; Mordike, B. L.; Mordike, S.; Ryk, G.; Halperin, G.; Etsion, I.: Microstructure and Tribological Properties of Ni-Based Claddings on Cu Substrates. WEAR 225-229 (1), S. 18 - 26 (1999)

Scheu, C.; Dehm, G.; Rühle, M.; Brydson, R.: Electron-energy-loss spectroscopy studies of Cu-α-Al₂O₃ interfaces grown by molecular beam epitaxy. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties 78 (2), S. 439 - 465 (1998)

Dehm, G.; Scheu, C.; Rühle, M.; Raj, R.: Growth and Structure of Internal Cu/Al₂O₃ and Cu/Ti/Al₂O3 Interfaces. Acta Materialia 46 (3), S. 759 - 772 (1998)

Scheu, C.; Dehm, G.; Kaplan, W. D.; Wagner, F.; Claussen, N. E.: Microstructure and Phase Evolution of Niobium-Aluminide-Alumina Composites Prepared by Melt-Infiltration. Physica Status Solidi A 166 (1), S. 241 - 255 (1998)

Dehm, G.; Scheu, C.; Möbus, G.; Brydson, R.; Rühle, M.: Synthesis of Analytical and High Resolution Transmission Electron Microscopy to Determine the Interface Structure of Cu/Al₂O₃. Ultramicroscopy 67 (1-4), S. 207 - 217 (1997)

Dehm, G.; Ernst, F.; Mayer, J.; Möbus, G.; Müllejans, H.; Phillipp, F.; Scheu, C.; Rühle, M.: Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung. Zeitschrift für Metallkunde 87 (11), S. 898 - 910 (1996)

Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al₂O₃. Materials Science Forum 207-209 (1), S. 217 - 220 (1996)

Scheu, C.; Dehm, G.; Müllejans, H.; Rühle, M.: Electron Energy-Loss Spectroscopy at Cu/Al₂O₃ and Ti/Al₂O₃ Interfaces. Materials Science Forum 207-209 (1), S. 181 - 184 (1996)