Zaefferer, S.: 3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation. Presentation at the scientific advisory board MPI Eisenforschung, MPI Eisenforschung GmbH, Düsseldorf, Germany (2007)
Bastos, A.; Zaefferer, S.; Raabe, D.: 3D EBSD Characterization of a Nanocrystalline NiCo Alloy by use of a High-resolution Field Emission SEM-EBSD Coupled with Serial Sectioning in a Focused Ion Beam Microscope (FIB). MRS Fall Conference, Boston, MA, USA (2006)
Kobayashi, S.; Zaefferer, S.: Determination of Phase Equilibria in the Fe3Al–Cr–Mo–C Semi-quaternary System Using a New Diffusion-multiple Technique. 12th International IUPAC Conference on High Temperature Materials Chemistry, Vienna, Austria (2006)
Zaefferer, S.; Sato, H.: Investigation of the formation mechanism of martensite plates in Fe-30%Ni by a high resolution orientation microscopy in SEM. ESOMAT 2006, Bochum (2006)
Kobayashi, S.; Zaefferer, S.; Raabe, D.: Relative Importance of Nucleation vs. Growth for Recrystallisation of Particle-containing Fe3Al Alloys. Fundamentals of Deformation and Annealing Symposium, Manchester, UK (2006)
Zaefferer, S.: High resolution orientation microscopy in 2 and 3 dimensions to study microstructure formation processes. 2. Warmumformtag (2.WUT), Düsseldorf (2006)
Zaafarani, N.; Raabe, D.; Singh, R. N.; Roters, F.; Zaefferer, S.; Zambaldi, C.: 3D EBSD characterization and crystal plasticity FE simulation of the texture and microstructure below a nanoindent in Cu. Plasticity Conference 2006, Halifax, Canada (2006)
Kobayashi, S.; Zaefferer, S.: Microstructure Control Using Phase Transformations in Ternary Gamma TiAl Alloys. Seminar talk, Universität Kassel, Kassel Germany (2006)
Zaefferer, S.: 3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization. 13th Conference on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Orientation microscopy on electrodeposited samples. 13th Conference and Workshop on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Characterization of microstructure and Texture of nanostructure electrodeposited NiCo samples by use of Electron Backscatter Diffraction (EBSD). DPG – Spring meeting, Dresden, Germany (2006)
Kobayashi, S.; Zaefferer, S.: Optimisation of Precipitation for the Development of Heat Resistant Fe3Al-based Alloys. Seminar talk, National Institute for Materials Science (NIMS), Tsukuba, Japan (2006)
Zaefferer, S.: Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. Materials Science Seminar, Institute for Materials Science, Krakow, Poland (2005)
Zaefferer, S.: Möglichkeiten und Grenzen der Orientierungsmikroskopie mittels EBSD im Rasterelektronenmikroskop. Werkstoffausschuss & Unterausschuss für Metallographie, Werkstoffanalytik und -simulation des VdeH, Düsseldorf (2005)