Publications of Gerhard Dehm
All genres
Journal Article (352)
341.
Journal Article
67 (1-4), pp. 207 - 217 (1997)
Synthesis of Analytical and High Resolution Transmission Electron Microscopy to Determine the Interface Structure of Cu/Al2O3. Ultramicroscopy 342.
Journal Article
45 (2), pp. 489 - 499 (1997)
A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire. Acta Materialia 343.
Journal Article
33 (1), pp. 45 - 53 (1997)
High Temperature Creep of Microcrystalline Dispersion Strengthened Copper Alloys. International Journal of Powder Metallurgy 344.
Journal Article
87 (11), pp. 898 - 910 (1996)
Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung. Zeitschrift für Metallkunde 345.
Journal Article
65 (3-4), pp. 217 - 228 (1996)
Retrieval of Crystal Defect Structures from HREM Images by Simulated Evolution. II. Experimental Image Evaluation. Ultramicroscopy 346.
Journal Article
63 (1), pp. 49 - 55 (1996)
Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons. Ultramicroscopy 347.
Journal Article
207-209 (1), pp. 217 - 220 (1996)
Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al2O3. Materials Science Forum 348.
Journal Article
207-209 (2), pp. 597 - 600 (1996)
Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum 349.
Journal Article
207-209 (1), pp. 181 - 184 (1996)
Electron Energy-Loss Spectroscopy at Cu/Al2O3 and Ti/Al2O3 Interfaces. Materials Science Forum 350.
Journal Article
150 (1), pp. 77 - 87 (1995)
Measurement of Coherency States of Metal-Ceramic Interfaces by HRTEM Image Processing. Physica Status Solidi A 351.
Journal Article
71 (6), pp. 1111 - 1124 (1995)
Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy. Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties 352.
Journal Article
6 (1), pp. 19 - 31 (1995)
Electron Energy-Loss Near-Edge Structure of Metal-Alumina Interfaces. Microscopy Microanalysis Microstructures Book (1)
353.
Book
In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley VCH Verlag, Weinheim, Germany (2012)
Book Chapter (7)
354.
Book Chapter
In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, pp. 425 - 438 (Eds.
355.
Book Chapter
Dehm, G.). Wiley VCH Verlag, Weinheim, Germany (2012)
In-situ TEM Straining Experiments: Recent Progress in Stages and Small-Scale Mechanics. In: In-situ Electron Microscopy: SEM and TEM Applications in Physics, Chemistry and Materials Science, pp. 227 - 254 (Ed. 356.
Book Chapter
Das Erich-Schmid-Institut für Materialwissenschaft (ESI) der Österreichischen Akademie der Wissenschaften. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom , W.). W. Rom, Graz, Austria (2005)
357.
Book Chapter
Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)
358.
Book Chapter
Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)
359.
Book Chapter
Nanokristallisierung durch Hochverformung. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)
360.
Book Chapter
1, pp. 2329 - 2331 (Eds. Buschow, .H.J.; Cahn, R.; Flemings, M.; Ilschner, .; Kramer, E. et al.) (2001)
TEM-Observation of Dislocations in Polycrystalline Metal Films. In: The Encyclopedia of Materials: Science and Technology, Vol.