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Malyar, N.; Micha, J.-S.; Dehm, G.; Kirchlechner, C.: Dislocation slip transfer at Cu grain boundaries analyzed by µLaue diffraction. Gordon Research Conference Thin Film & Small Scale Mechanical Behavior, Best Poster Prize, Lewiston, ME, USA (2016)

Peter, N. J.; Kirchlechner, C.; Liebscher, C.; Dehm, G.: Effect of the atomistic grain boundary structure on dislocation interaction in copper. Gordon Research Conference (GRC) 2016, Thin Film & Small Scale Mechanical Behavior , Lewiston, ME, USA (2016)

Gleich, S.; Djaziri, S.; Bolvardi, H.; Schneider, J. M.; Dehm, G.; Scheu, C.: Nanostructure of Mo₂BC thin films and the effect on mechanical properties. European Microscopy Congress 2016, Lyon, France (2016)

Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: A New Method to Study the Composition Dependence of Mechanical Properties of Intermetallic Phases. Int. Conf. The Materials Chain: From Discovery to Production, University Bochum, Bochum, Germany (2016)

Meiners, T.; Liebscher, C.; Dehm, G.: Atomic structure and segregation phenomena at copper grain boundaries. EMC2016, The 16th European Microscopy Congress, Lyon, France (2016)

Peter, N. J.; Kirchlechner, C.; Liebscher, C.; Dehm, G.: Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu grain boundary. European Microscopy Congress (EMC) 2016 , Lyon, France (2016)

Soler, R.; Hahn, R.; Bartosik, M.; Kirchlechner, C.; Dehm, G.; Mayrhofer, P. H.: Can Superlattice Structures Enhance the Fracture Toughness of Hard Coating? Thin Film & Small Scale Mechanical Behavior, Gordons Research Conferences (GRC), Lewiston, ME, USA (2016)

Malyar, N.; Jaya, B. N.; Micha, J.-S.; Dehm, G.; Kirchlechner, C.: Orientation dependence of dislocation transmission through twin-boundaries studied by in situ μLaue diffraction. ECI - Nano- and Micromechanical Testing in Materials Research and Development V, Albufeira, Portugal (2015)

Hieke, S. W.; Dehm, G.; Scheu, C.: Electron microscopy investigation of solid state dewetted epitaxial Al thin films on sapphire. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices (IAMNano 2015), Hamburg, Germany (2015)

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. TEM-UCA: Transmission Electron Microscopy of Nanomaterials - European Summer Workshop (TEM-UCA 2015), Cádiz, Spain (2015)

Hodnik, N.; Dehm, G.; Mayrhofer, K. J. J.: Electrochemical water based in-situ TEM: case study of platinum based nanoparticles potential- and time-dependent changes. IAM Nano 2015 , Hamburg, Germany (2015)

Malyar, N.; Jaya, B. N.; Dehm, G.; Kirchlechner, C.: Dislocation transmission in bi-crystalline micro pillars studied by in situ SEM and in situ µLaue diffraction. Workshop „Understanding Grain Boundary Migration – Theory Meets Experiment”, Günzburg, Germany (2015)

Hieke, S. W.; Dehm, G.; Scheu, C.: Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. 8th International Conference on High Temperature Capillarity (HTC-2015), Bad Herrenalb, Germany (2015)

Fink, C.; Brinckmann, S.; Dehm, G.: Nanotribology in Pearlite. German-French summer school 2015 "Tribology Today", Bad Herrenalb, Germany (2015)

Gleich, S.; Djaziri, S.; Brinckmann, S.; Bolvardi, H.; Schneider, J. M.; Dehm, G.; Scheu, C.: Nanostructure and micromechanical properties of Mo₂BC thin films. IAMNano 2015 Hamburg: International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Hamburg, Germany (2015)

Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: A New Method to Study the Composition Dependence of Mechanical Properties of Laves Phases. Intermetallics 2015, Educational Center Kloster Banz, Bad Staffelstein, Germany (2015)

Hieke, S. W.; Dehm, G.; Scheu, C.: Solid state dewetting phenomena of epitaxial Al thin films on sapphire (α-Al₂O₃). 2nd International Multidisplinary Microscopy Congress (InterM 2014), Oludeniz, Fethiye, Turkey (2014)

Harzer, T. P.; Raghavan, R.; Djaziri, S.; Dehm, G.: TEM study of nanostructured Cu–Cr alloys. 18th International Microscopy Congress, Prague, Czech Republic (2014)

Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Fracture toughness testing of brittle materials at the micron-scale. Thin Film & Small Scale Mechanical Behavior - Gordon Research Conference, Boston, MA, USA (2014)

Marx, V. M.; Toth, F.; Wiesinger, A.; Berger, J.; Kirchlechner, C.; Cordill, M. J.; Rammerstorfer, F. G.; Dehm, G.: In situ investigation of the interlayer dominated failure of Cu thin films for flexible electronic devices. Gordon Research Conference “Thin Film and Small Scale Mechanical Behavior”, Bentley University, Waltham, Waltham, MA, USA (2014)