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Yamada, K.; Horiuchi, T.; Saito, S.; Ikeda, K.; Miura, S.; Stein, F.: Compressive Deformation Behavior of Nb₂Co₇-Co Solid Solution Dual-phase Alloys. Intermetallics 2023, Educational Center Kloster Banz, Bad Staffelstein, Germany (2023)

Ma, Y.; Sun, B.; Schökel, A.; Song, W.; Ponge, D.; Raabe, D.; Bleck, W.: Discontinuous yielding in ultrafine-grained duplex medium-Mn steels. Discontinuous yielding in ultrafine-grained duplex medium-Mn steels, Darmstadt, Germany (2023)

Jung, C.: Atom probe tomography for nanostructured functional materials. Korea Institute of Energy Research, Daejeon, South Korea (2023)

Zhang, S.: Electron microscopy: Resolution and imaging contrast. DMG/DGK-AK9 Summer School “Advanced methods for the characterization of applied materials”, MPI für Kohlenforschung, Mülheim (Ruhr), Germany (2023)

Jung, C.: Sample preparation of nanomaterials for atom probe tomography. Hanbat National University, Daejeon, South Korea (2023)

Jung, C.: Advanced characterization for functional nanomaterials. Korea University, Seoul, South Korea (2023)

Hatipoglu, E.; Saksena, A.; Michael Schneider, J.; Gault, B.; El-Zoka, A.: Probing Dealloying Mechanisms in Thin-Film Nanoporous Metals Using Atom Probe Tomography. Atom Probe Tomography & Microscopy, Leuven, Belgium (2023)

Li, Y.; Gault, B.: Machine learning-enabled tomographic imaging of chemical short-range ordering in CoCrNi alloys. APT&M 2023, Leuven, Belgium (2023)

Saksena, A.; Sun, B.; Dong, X.; Khanchandani, H.; Gault, B.: Visualizing radiation-induced damage by Hydrogen/Deuterium. APT&M, Frankfurt, Germany (2023)

Woods, E.; Aota, L. S.; Schwarz, T.; Singh, M. P.; Zhang, S.; Douglas, J.; Gault, B.: Site-specific preparation and atom probe tomography of bulk water ice and amino acid solutions. Atom Probe Tomography & Microscopy, Leuven, Belgium (2023)

Nallathambi, V.; Wang, C.; Reichenberger, S.; Gault, B.; Eychmüller, A.; Barcikowski, S.; Raabe, D.: Identifying multielement active sites as a design strategy for high-performance laser-generated H₂O₂ electrocatalysts. Atom Probe Tomography & Microscopy conference, Leuven, Belgium (2023)

Aymerich Armengol, R.: Techniques for the assessment of the stability of (sea) water splitting nanocatalysts. Korean Institute for Energy Research, Jeju, South Korea (2023)

Jung, C.: Sample preparation of nanomaterials for atom probe analysis. NRF-DFG meeting “Electrodes for direct sea-water splitting and microstructure based stability analyses”, Korean Institute for Energy Research, Jeju, South Korea (2023)

Vega-Paredes, M.; Aymerich Armengol, R.; Scheu, C.: Determining the degradation mechanisms and active species of electrocatalysts by identical location electron microscopy. NRF-DFG meeting “Electrodes for direct sea-water splitting and microstructure based stability analyses”, Korean Institute for Energy Research, Jeju, South Korea (2023)

Zhang, S.; Kim, S.-H.; Mingers, A. M.; Gault, B.; Scheu, C.: Operando Study on the activation of hydrogen evolution electrocatalysts. NRF-DFG meeting “Electrodes for direct sea-water splitting and microstructure based stability analyses”, Korean Institute for Energy Research, Daejeon, South Korea (2023)

Rohwerder, M.: Probe Techniques for mapping effective local hydrogen activity and permeation rates. International Hydrogen Conference (IHC) 2023, Park City, UT, USA (2023)

Schwarz, T.: Atom probe tomography: from water to complex liquids to the application of studying liquid-solid interfaces at the near atomic level. APT&M 23, Leuven, Belgium (2023)

Jung, C.: NbCoSn half-Heusler compounds through crystallization of amorphous precursors. Korea Institute of Ceramic Engineering and Technology, Jinju, South Korea (2023)

Woods, E.; Aota, L. S.; Schwarz, T.; Singh, M. P.; Zhang, S.; Douglas, J. O.; Gault, B.: Site-specific preparation and atom probe tomography of frozen liquids. IMC20 - 20th International Microscopy Congress, Busan, South Korea (2023)

Jung, C.; Jang, K.; Zhang, S.; Bueno Villoro, R.; Choi, P.-P.; Scheu, C.: Sb-doping induced order to disorder transition enhances the thermal stability of NbCoSn1-xSbx half-Heusler semiconductors. The 20th International Microscopy Congress, PS-07.2. Microscopy of Semiconductor Materials and Devices, Busan, Republic of Korea (2023)