Thin Film Metrology

Thin Film Metrology

  • Date: Mar 1, 2012
  • Time: 09:00 AM - 05:00 PM (Local Time Germany)
  • Location: Max-Planck-Institut für Eisenforschung GmbH
  • Room: Seminar Room 1
  • Host: SENTECH/MPIE
The seminar "Thin Film Metrology" focuses on optical methods and applications for thin film analysis. Basics of spectroscopic ellipsometry, reflectometry and transmission measurements are presented. Contributions from experts cover the analysis of the properties of metallic surfaces, transparent conductive thin films, dielectric, magnetic and organic materials. The invited experts come from various research areas. Register as soon as possible, as the number of participants is limited to 30. You can send your registration per mail: sales@sentech.de or per Fax: +49 / 89 / 897 9607-22 For further questions please contact SENTECH under: +49 / 89 / 897 9607- 0
Go to Editor View