Konferenzbeitrag
Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Moody, M. P.; Grabowski, B.; Gault, B.; Raabe, D.; Neugebauer, J.: High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations. In: Proceedings of Microscopy & Microanaalysis 2017, Bd.
23, S. 642 - 643. Microscopy and Microanalysis 2017, St. Louis, MO, USA, 06. August 2017 - 10. August 2017. Cambridge University Press, New York, NY, USA (2017)