Konferenzbeitrag
Mehrtens, T.; Bley, S.; Schowalter, M.; Sebald, K.; Seyfried, M.; Gutowski, J.; Gerstl, S. A.; Choi, P.; Raabe, D.; Rosenauer, A.: A (S)TEM and atom probe tomography study of InGaN. 17th International Conference on Microscopy of Semiconducting Materials 2011, Churchill College, University of Cambridge, UK, 04. April 2011 - 07. April 2011. Journal of Physics, Conference Series
326 (012029), S. 1 - 4 (2011)