Konferenzbeitrag
Schillinger, W.; Zhang, D.; Dehm, G.; Bartels, A.; Clemens, H.: Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl (Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing. In: Materials Research Society Symposium - Proceedings, Bd.
646, S. N141 - N146. Materials Research Society Symposium - High Temperature Ordered Intermetallic Alloys IX, Code 59218, Boston, MA, USA, 27. November 2000 - 29. November 2000. (2001)